Getter Device Placement in Thermal Analysis Apparatus
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Solution Overview
Problem
Residual oxygen in inert gas atmospheres within thermal analysis devices falsifies results by causing sample oxidation, as existing methods for purifying inert gases are insufficient due to leakage and desorption from apparatus surfaces.
Innovation Solution
Incorporating oxygen trap devices, or getter devices, in the inert gas flow path ahead of the sample carrier to absorb residual oxygen, combined with heating elements that heat the getter material to high temperatures, ensuring the inert gas is purified before reaching the sample.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If purification of the purge gas is performed before it enters the apparatus, then the residual oxygen content of the inert gas is reduced, but the purity of the inert gas deteriorates again due to leakage and desorption from apparatus walls
Solution Approach 1:
The getter device is activated and positioned upstream in the gas flow path before the gas reaches the sample chamber. By performing oxygen removal in advance (preliminary action) at a location where oxygen concentration is still high, the system achieves effective oxygen reduction without continuous reliance on vacuum tightness during the measurement process
Solution Approach 2:
A getter material acts as an intermediary substance that chemically binds with residual oxygen molecules in the inert gas stream. This intermediary mechanism transforms the physical problem of leakage and desorption into a chemical absorption process, effectively removing oxygen regardless of its source
2Measurement precision
If the getter devices are arranged close to the sample carrier, then oxygen removal efficiency is improved, but the risk of direct contact between getter material and sample increases
Solution Approach 1:
The sample carrier and getter device are positioned in different local zones within the sample chamber. The getter device operates in an upstream zone where oxygen concentration is high, while the sample carrier is protected in a downstream zone. This spatial differentiation of functional zones allows efficient oxygen removal while maintaining sample protection
Solution Approach 2:
The harmful function of the getter material (potential sample contamination) is separated from its useful function (oxygen removal). By extracting the getter device from direct proximity to the sample and positioning it upstream in the gas flow, the system achieves oxygen removal while eliminating the contamination risk through spatial separation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Effectively reduces residual oxygen concentration near the sample, preventing oxidation and ensuring accurate thermal analysis results by maintaining the inert gas purity throughout the measurement process.
Implementation Method 1
getter devices (oxygen trap device) for removing residual oxygen from the inert gas
Implementation Method 2
the heating devices are designed, in particular designed, shaped and/or arranged, to heat the getter material to a temperature of 400 °C or more
Data Source
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AI summary
The present invention relates to a thermal analysis apparatus (1), comprising a sample space (2) in which a sample carrier (3) and heating devices (4) as well as an inert gas (5) are present, wherein additionally flow devices (6) are present for the inert gas (5) for generating an inert gas flow (7) to the sample carrier (3) and getter devices (11) are present for removing residual oxygen from the inert gas (5), wherein the getter devices (11) are disposed in the inert gas flow (7) in the flow direction upstream of the sample carrier (3) in the vicinity thereof. The invention further relates to a thermal analysis apparatus (1), comprising a sample space (2) in which a sample carrier (3) and heating devices (4) as well as an inert gas (5) are present, wherein additionally flow devices (6) are present for the inert gas (5) for generating an inert gas flow (7) to the sample carrier (3) and oxygen trap devices (8) are present for removing residual oxygen from the inert gas (5), wherein the getter devices (8) are disposed in the inert gas flow (7) in the flow direction upstream of the sample carrier (3) in the vicinity thereof. In addition, the invention relates to a thermal analysis method, wherein in a sample space (2) a sample carrier (3) and heating devices (4) are surrounded by inert gas (5), and wherein the inert gas (5) is prompted to flow as an inert gas flow (7) in the sample space (2) first over or past getter devices (11) in order to remove residual oxygen from the inert gas (5) and then to flow to the sample carrier (3), which is disposed in the vicinity of the getter devices (11).