Glass-Core Packaging Substrate to Suppress RDL Thermal Stress

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Solution Overview

Problem

Existing semiconductor packaging technologies face challenges in effectively integrating high-performance high-frequency semiconductor elements due to limitations in reducing wiring pitch and thermal stress issues with ceramic or resin substrates, leading to suboptimal electrical performance.

Innovation Solution

A packaging substrate comprising a glass core with a controlled thickness and an insulating layer having specific heat-resistant elasticity and mechanical properties, including a heat-resistant elasticity index (HEI) and heat-resistant mechanical property index (HMI), is used to mitigate thermal stress and enhance electrical connectivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If ceramic substrate is used for packaging, then high resistance and dielectric constant are achieved, but mounting of high-performance high-frequency semiconductor elements becomes difficult

Engineering Contradiction:
Improveelectrical insulation performanceVSAvoidmounting capability for high-frequency elements
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent employs a composite substrate structure combining glass core layer with resin-based insulating layers. The glass core provides dimensional stability and low dielectric loss, while the resin layers provide flexibility for mounting high-frequency elements. This composite approach resolves the contradiction by integrating materials with complementary properties.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

Different regions of the substrate have different material compositions optimized for specific functions. The glass core layer provides stable electrical properties in critical signal paths, while resin-based insulating layers provide adaptability for element mounting. This local differentiation allows simultaneous achievement of insulation performance and mounting capability.

Inventive Principle:
Principle #3Local quality

2Adaptability or versatility

If resin substrate is used for packaging, then mounting of high-performance high-frequency semiconductor elements is enabled, but wiring pitch reduction is limited

Engineering Contradiction:
Improvemounting capability for high-frequency elementsVSAvoidwiring pitch
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The multi-layer composite structure allows combining materials with different properties. The glass core enables precise wiring formation due to its dimensional stability, while outer resin layers provide flexibility for fine-pitch wiring. This resolves the contradiction between mounting capability and wiring pitch reduction.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent uses multiple layers stacked in the vertical dimension to achieve fine wiring pitch in the horizontal dimension. By distributing wiring across multiple layers, the effective pitch is reduced without requiring excessively fine single-layer features, thus enabling both high-frequency element mounting and fine wiring.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If through holes are formed in silicon or glass substrate, then wiring length is shortened and electrical characteristics improve, but thermal stress and insulating layer peeling occur

Engineering Contradiction:
Improveelectrical characteristicsVSAvoidthermal stress resistance
Core Design Contradiction:
ReliabilityVSStrength

Solution Approach 1:

The multi-material layered structure distributes thermal stress across layers with different thermal expansion coefficients. The glass core and resin layers are designed with compatible CTE values to minimize stress concentration around through-holes, preventing peeling while maintaining electrical performance.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent carefully controls the thickness and material composition parameters of each layer to optimize thermal stress distribution. By adjusting the CTE match between layers and controlling layer thickness ratios, the structure accommodates thermal expansion differences without causing delamination, thus maintaining both electrical characteristics and structural integrity.

Inventive Principle:
Principle #35Parameter changes

4Reliability

If insulating layer is applied on glass core, then electrical insulation is provided, but thermal stress causes peeling of the insulating layer

Engineering Contradiction:
Improveelectrical insulationVSAvoidinsulating layer adhesion
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent optimizes the CTE match between the glass core and insulating layer by selecting specific glass compositions and resin formulations. The glass core has CTE of 65-75 ppm/°C, while the insulating layer is formulated to have compatible CTE values, minimizing differential thermal expansion and preventing peeling while maintaining electrical insulation.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The use of a glass core with specific compositional characteristics provides a stable base that reduces thermal stress. The combination of glass core with carefully formulated resin insulating layers creates a composite structure where thermal expansion is harmonized, preventing delamination while providing effective electrical insulation.

Inventive Principle:
Principle #40Composite materials

Data Source

PatentUS20260005085A1Packaging substrate and semiconductor package comprising same
Publication Date: 2026.01.01 ABSOLICS INC
  • US20260005085A1 patent drawing
  • US20260005085A1 patent drawing
  • US20260005085A1 patent drawing

AI summary

A packaging substrate according to the present disclosure includes a glass core and an insulating layer disposed on the glass core. The glass core has a thickness of 100 μm or more. The insulating layer has an HEI value, which is the heat-resistant elasticity index of Equation 1 below, of 1.2 or more.HEI=TgE×CTE[Equation⁢ 1]in Equation 1,Tg is the glass transition temperature (unit: ° C.), E is the elastic modulus (unit: GPa) measured at 23° C., and CTE is the coefficient of thermal expansion (ppm/° C.).In this case, damage to the glass core during a process of forming a redistribution layer can be effectively suppressed.