Glass Substrate High Transmittance Melt Failure Detection
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Solution Overview
Problem
Large-sized glass substrates pose challenges in melt failure detection due to increased light absorption, leading to reduced illuminance and difficulty in detecting defects, especially for substrates larger than 1,100 mm×1,250 mm, which affects the productivity and quality of flat panel displays.
Innovation Solution
Regulating the transmittance at specific wavelengths (500-800 nm and 550-650 nm) and optimizing the glass composition to ensure sufficient light transmission and reduce the influence of impurities like Cr3+, resulting in a glass substrate with high transmittance and improved melt failure detection precision.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the substrate size of a glass substrate is increased to improve productivity and decrease cost by producing multiple devices on one substrate, then the productivity and cost-effectiveness are improved, but the melt failure detection precision deteriorates due to increased light absorption and reduced illuminance
Solution Approach 1:
The patent changes the optical parameters of the glass substrate by controlling the content of light-absorbing impurities (Fe2O3, Cr2O3, MnO, NiO, CoO) to specific ranges. This parameter change reduces light absorption, maintains sufficient illuminance across large substrate areas, and enables effective melt failure detection while preserving the benefit of large substrate size for high productivity
2Adaptability or versatility
If the substrate size of a glass substrate is increased to produce large-sized displays, then the adaptability for large displays is improved, but the melt failure detection precision deteriorates due to longer light transmission path and reduced transmitted light quantity
Solution Approach 1:
The patent modifies the chemical composition parameters of the glass substrate by strictly controlling impurity content (Fe2O3: 0.001-0.03 mass%, Cr2O3: 0.0001-0.002 mass%, MnO: 0.001-0.01 mass%, NiO: 0.001-0.005 mass%, CoO: 0.001-0.005 mass%). This parameter optimization reduces light absorption coefficient, ensuring sufficient light transmission and illuminance for melt failure detection in large-sized substrates while maintaining adaptability for large display applications
3Measurement precision
If the illuminance at the light source side is increased to improve melt failure detection precision, then the detection precision is improved, but the image quality deteriorates due to excessive brightness around the substrate end surface
Solution Approach 1:
The patent converts the harmful effect of light absorption by impurities into a benefit by controlling impurity content to optimize light transmission. This approach allows sufficient light to reach the detection side without requiring excessive light source intensity, thereby maintaining both high melt failure detection precision and good image quality without the adverse effects of over-illumination
Solution Approach 2:
The patent changes the optical parameters of the glass substrate by controlling impurity content, which reduces light absorption and improves light transmission. This parameter optimization enables effective melt failure detection at normal illuminance levels, avoiding the need to increase light source intensity and thus preventing image quality deterioration from excessive brightness
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables effective detection of melt failures on large glass substrates, ensuring higher definition and performance in displays by maintaining sufficient illuminance and reducing image failures, thus enhancing the productivity and cost-effectiveness of glass substrate production.
Implementation Method 1
the melt failure check of a glass substrate is carried out by allowing a light to enter from one substrate end surface of a glass substrate and detecting the light transmitted to the other substrate end surface side
Implementation Method 2
if a melt failure is present in the glass substrate, the incident light from one substrate end surface collides with the melt failure and is scattered, thus, the presence or absence of melt failures can be detected by observing and measuring the scattered light
Implementation Method 3
when the substrate size of a glass substrate becomes large, the route length to the other substrate end surface side becomes longer, and the proportion of the incident light absorbed by glass increases
Data Source
AI summary
Provided is a glass substrate, which has a substrate size of 1,100 mm×1,250 mm or more, and a transmittance at a wavelength of 500 to 800 nm and at a route length of 50 mm of 80% or more.