Glitter Coating Reflectance Analysis via Multi-Angle Wavelength Difference
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Solution Overview
Problem
Existing techniques for evaluating the texture of glitter material-containing coating films are inadequate as they cannot accurately assess the texture when reflected light is measured from a single light receiving angle, and the reflectance of these films changes with wavelength and geometry, requiring multi-angle measurements to account for physical characteristics like roughness.
Innovation Solution
An optical analysis device and method that measures the reflectance of glitter material-containing coating films at multiple wavelengths and angles, calculating a difference value between peak and secondary reflectance components to determine physical characteristics such as roughness, using a multi-angle colorimeter with a measurement part, calculator, and storage to correlate these values with physical indices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If reflected light is measured from a single light receiving angle using a colorimeter, then the measurement process is simple, but the texture characteristics of the glitter material-containing coating film cannot be accurately evaluated
Solution Approach 1:
The patent transitions from single-angle measurement to multi-angle measurement by adding the dimension of measurement angles. The colorimeter is configured to measure reflected light at multiple light receiving angles (e.g., 0°, 45°, 90°) relative to the light incident angle, enabling comprehensive evaluation of glitter material texture characteristics that vary with viewing angle.
Solution Approach 2:
The patent changes the measurement parameters by measuring reflectance at multiple wavelengths (e.g., 400-700nm in 10nm intervals) and multiple angles simultaneously. This multi-parameter approach captures the complex optical behavior of glitter materials, including interference patterns and viewing angle dependence, which cannot be obtained through single-parameter measurement.
2Measurement precision
If multi-angle colorimeter is used to measure reflected light from multiple light receiving angles, then the texture evaluation accuracy is improved, but the measurement time and complexity increase
Solution Approach 1:
The patent implements continuous spectral measurement across the visible range (400-700nm) at each measurement angle without interruption. The colorimeter continuously scans through all wavelengths and angles according to a predetermined sequence, efficiently capturing the complete optical characteristics of the coating film in a single measurement session.
Solution Approach 2:
The patent pre-establishes the measurement protocol by determining optimal wavelength intervals (e.g., 10nm) and angle sequences before actual measurement. This preliminary configuration allows the system to efficiently execute the measurement plan, reducing redundant operations and minimizing total measurement time while ensuring all necessary data points are captured.
3Loss of information
If the reflectance is measured at multiple wavelengths to account for wavelength-dependent characteristics, then the evaluation comprehensiveness is improved, but the data processing complexity increases
Solution Approach 1:
The patent utilizes the wavelength-dependent color characteristics of glitter materials by measuring reflectance across the entire visible spectrum (400-700nm). The interference patterns produced by glitter materials create characteristic reflectance curves at different wavelengths, which serve as fingerprints for identifying and evaluating specific optical properties such as particle size, layer thickness, and material composition.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate determination of physical characteristics like roughness and other indices of glitter materials in coating films without the need for additional measurement tools like cameras, improving the evaluation of texture and reflectance properties.
Implementation Method 1
the reflectance of the first wavelength component and the reflectance of the second wavelength component of the reflected light in the highlight direction
Data Source
AI summary
A difference between a peak reflectance of a first wavelength component and a reflectance of a second wavelength component having a predetermined wavelength among reflectances of a plurality of wavelength components constituting reflected light in a highlight direction from a glitter material-containing coating film is set as a first difference value. Reflectance is measured of the first and second wavelength components of the reflected light in the highlight direction for the coating film corresponding to a measurement object. A first difference value is calculated by using the measurement result. A storage stores in advance correlation information indicating a correlation between the first difference value and an index value indicating predetermined physical characteristics of a glitter material contained in the coating film. An index value calculator calculates the index value of the coating film corresponding to the measurement object by using the correlation information and the first difference value calculated in the first calculator.