Glue Circuit Speed Conversion for P1500 BIST Interfaces
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The P1500 standard for testing operations lacks a method to efficiently convert between high-speed and low-speed input/output signals for built-in self-test (BIST) circuits, leading to design complexity and longer run times in memory systems, as standard low-speed P1500 blocks are limited by slow input/output capabilities.
Innovation Solution
The implementation of glue circuits that convert between first speed and second speed input/output signals, allowing for the interface between high-speed and low-speed P1500 blocks, enabling shorter run times and reducing design complexity by serializing/deserializing signals to match different frequency operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If standard low-speed P1500 blocks are used for testing, then compatibility with existing test interfaces is maintained, but input/output speed is limited and run times are extended
Solution Approach 1:
A speed conversion circuit is introduced as an intermediary component between the high-speed BIST circuit and the low-speed P1500 test interface. This mediator performs signal speed conversion, allowing the BIST circuit to operate at high speed while maintaining compatibility with low-speed test interfaces through the conversion circuit.
2Duration of action of moving object
If high-speed BIST circuits are implemented, then test run times are reduced, but design complexity increases due to lack of conversion methods
Solution Approach 1:
The speed conversion circuit serves as a mediator that simplifies the overall design by providing a standardized interface between high-speed BIST circuits and low-speed P1500 interfaces. This intermediary component reduces design complexity by handling the speed conversion logic in a dedicated module rather than requiring complex integration throughout the system.
Solution Approach 2:
The test system is segmented into distinct functional modules: the high-speed BIST circuit module, the speed conversion circuit module, and the low-speed P1500 interface module. This segmentation allows each module to be optimized independently while maintaining clear interfaces between them, reducing overall design complexity.
3Adaptability or versatility
If speed conversion circuits are added, then interface compatibility is improved, but device complexity increases
Solution Approach 1:
The speed conversion circuit is designed as a universal interface component that can adapt to different BIST circuit speeds while maintaining a standardized low-speed P1500 interface. This multi-functional component handles both high-speed and low-speed signal domains, reducing the need for multiple specialized conversion circuits.
Data Source
AI summary
Test input/output speed conversion and related apparatuses and methods are disclosed. An apparatus includes a glue circuit and a BIST circuit for core circuitry of an integrated circuit device. The, the BIST circuit includes a test interface, one or more inputs, and one or more outputs. The BIST circuit is configured to operate at a first speed. The glue circuit is configured to interface with the test interface, the one or more inputs, and the one or more outputs of the BIST circuit. The glue circuit is configured to convert between second speed test interface signals and second speed input/output signals operating at a second speed and first speed test interface signals and first speed input/output signals operating at the first speed. The second speed is different from the first speed.