Glycolic Acid Texturing for Silicon Light Trapping

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Solution Overview

Problem

Conventional texturing etch technologies face challenges in achieving uniformity and increased surface density of projections and recesses on silicon substrates, leading to inefficiencies in light trapping and reflectance, particularly in mass production of photovoltaic cells, where variations in mc-silicon quality require customized etching solutions.

Innovation Solution

A method involving an etching solution containing glycolic acid, hydrofluoric acid, nitric acid, and water, with a surfactant, which forms a continuous pattern of disruptions on the silicon substrate surface, minimizing light reflectance and maintaining etch rates suitable for manufacturing operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional etching solutions (caustic or acidic) are used to texturize silicon substrates, then light trapping efficiency is improved, but uniformity of the texture pattern and etch rate consistency vary with mc-silicon quality

Engineering Contradiction:
Improvelight trapping efficiencyVSAvoiduniformity of texture pattern
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent changes the chemical composition parameters of the etching solution by introducing glycolic acid (at concentrations of 1-50 wt%, preferably 5-20 wt%) in combination with hydrofluoric acid and nitric acid. This parameter change creates a more consistent etching reaction that produces uniform pyramidal structures across different mc-silicon qualities, resolving the contradiction between light trapping efficiency and texture uniformity.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If etching solution concentrations are customized to match mc-silicon quality variations, then manufacturing adaptability is improved, but process complexity and production time increase

Engineering Contradiction:
Improveadaptability to mc-silicon quality variationsVSAvoidmass production efficiency
Core Design Contradiction:
Adaptability or versatilityVSProductivity

Solution Approach 1:

The patent creates a universal etching solution formulation containing glycolic acid, hydrofluoric acid, and nitric acid that can handle variations in mc-silicon quality without requiring customization. This multi-functional solution works across different silicon batches, maintaining both adaptability to material variations and high productivity for mass production.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Use of energy by moving object

If higher surface density of projections and recesses is achieved, then light absorbance is improved, but light reflectance may increase if uniformity is not maintained

Engineering Contradiction:
Improvelight absorbanceVSAvoidlight reflectance
Core Design Contradiction:
Use of energy by moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent creates localized pyramidal structures with specific geometric characteristics through the glycolic acid-based etching solution. These locally optimized structures have proven to minimize light reflectance while maximizing absorbance, as the pyramidal geometry at each local point is precisely controlled by the etching chemistry rather than being randomly distributed.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method produces a textured silicon substrate with a high surface density of disruptions, reducing light reflectance to as low as 12% across 300-900 nm wavelengths, enhancing light absorbance and energy conversion efficiency in photovoltaic cells while maintaining etch rates and uniformity.

Implementation Method 1

contacting the substrate with an etching solution comprising glycolic acid, hydrofluoric acid, and nitric acid; etching a surface of the substrate thereby forming disruptions in said surface of the substrate

Methodology Applied
Scientific EffectChemical etching: Chemical Bonding

Data Source

PatentUS8940178B2Textured silicon substrate and method
Publication Date: 2015.01.27 PURETECH SCI LLC
  • US8940178B2 patent drawing
  • US8940178B2 patent drawing
  • US8940178B2 patent drawing

AI summary

A method of texturizing a silicon substrate comprising a) contacting the substrate with an etching solution comprising glycolic acid, b) etching a surface of the substrate thereby forming disruptions in said surface of the substrate, and c) removing the etching solution to yield a texturized substrate, said texturized substrate having a plurality of disruptions in at least one surface with a surface density of disruptions of a minimum of 60 disruptions in a 400 micron square area.