GOA Detection Circuit for Display Panel Signal Interference

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Solution Overview

Problem

In the development of larger and higher-resolution display panels, such as LCDs and OLEDs, the working status of Gate-on-Array (GOA) drive circuits is critical for production yield and visual quality, but existing technologies face challenges in accurately detecting abnormalities and inter-stage signal interference, which hinders efficient manufacturing and repair processes.

Innovation Solution

A GOA detection circuit is introduced, featuring a data collection wire and unilateral conduction TFTs acting as diodes to block signal interference between stages, along with a time signal control system for abnormality detection, enabling rapid identification of faults and multi-pulse position determination through a testing method that includes a GOA circuit module and detection signal collection module.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a GOA drive circuit is formed on substrate around display area to replace external IC, then device integration is improved, but signal interference between different stages occurs

Engineering Contradiction:
Improvedevice integrationVSAvoidsignal interference
Core Design Contradiction:
Adaptability or versatilityVSObject-generated harmful factors

Solution Approach 1:

The patent introduces a detection circuit as an intermediary component between the GOA drive circuit stages. This detection circuit includes detection wires and control transistors that act as mediators to monitor and identify signal interference without disrupting the integrated GOA drive functionality. The intermediary detection mechanism allows the system to maintain high integration while actively managing and detecting harmful signal interference.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If traditional GOA stage-transmission circuit is used, then device complexity is reduced, but abnormality detection precision deteriorates

Engineering Contradiction:
Improvecircuit structureVSAvoidabnormality detection precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent segments the GOA drive circuit into multiple detectable stages by introducing individual detection wires and control transistors for each stage. This segmentation allows the complex integrated circuit to be divided into monitorable units, enabling precise identification of which specific stage is experiencing abnormalities without requiring a complete redesign of the entire circuit architecture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The detection circuit implements a feedback mechanism where detection wires monitor the output of each GOA stage and feed this information back through control transistors to a detection node. This feedback system enables continuous monitoring and precise detection of signal abnormalities, allowing the system to maintain simple overall structure while achieving high detection precision through active monitoring loops.

Inventive Principle:
Principle #23Feedback

3Area of stationary object

If multiple GOA units are cascaded to drive scanning lines, then scanning coverage is improved, but mutual interference between stages increases

Engineering Contradiction:
Improvescanning coverageVSAvoidmutual interference
Core Design Contradiction:
Area of stationary objectVSObject-generated harmful factors

Solution Approach 1:

The patent places detection wires and control transistors as intermediary elements between cascaded GOA units. These intermediaries monitor the signal transitions between stages, allowing the system to maintain extensive scanning coverage through multiple cascaded units while detecting and managing any mutual interference that occurs between adjacent stages.

Inventive Principle:
Principle #24Intermediary (Mediator)

4Ease of manufacture

If yield determination and fault detection are performed manually, then manufacturing cost is reduced, but productivity deteriorates

Engineering Contradiction:
Improvetesting costVSAvoidyield determination speed
Core Design Contradiction:
Ease of manufactureVSProductivity

Solution Approach 1:

The detection circuit enables the GOA drive circuit to self-diagnose abnormalities through built-in detection wires and control transistors. During manufacturing testing, the circuit automatically identifies faults and determines yield without requiring complex external testing equipment or manual inspection, thereby maintaining low manufacturing costs while significantly improving testing speed and productivity.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution allows for rapid determination of GOA unit yield and accurate fault localization, facilitating repair and design improvements in display panels by effectively blocking signal interference and detecting abnormalities, thereby enhancing manufacturing efficiency.

Implementation Method 1

Each of the unilateral conduction component is configured to prevent mutual interference between output signals of different stages of GOA units

Methodology Applied
Scientific EffectUnilateral conduction: Diode

Data Source

PatentUS10839765B2GOA detection circuit and testing method therefor
Publication Date: 2020.11.17 WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO LTD
  • US10839765B2 patent drawing
  • US10839765B2 patent drawing
  • US10839765B2 patent drawing

AI summary

The present disclosure provides a gate on array (GOA) detection circuit and a detection method. The GOA detection circuit includes a GOA circuit module and a detection signal collection module. The GOA circuit module includes a plurality of scanning lines, a GOA circuit, a plurality of common control thin film transistors (TFT), and a plurality of single-stage control TFTs. An output end of each scanning line is connected to a signal collection line. A gate of each common control TFT is connected to a detection signal control wire of the detection signal collection module, and a source of each common control TFT is connected to the signal collection line. A test point for detecting an electrical signal is disposed on the signal collection line.