GOA Circuit Testing via Transparent ITO Pads
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Solution Overview
Problem
Conventional methods for testing Gate On Array (GOA) circuit modules in display panels face challenges in identifying defects due to difficulties in testing individual Thin Film Transistors (TFTs) and output signals, often requiring damaging the panel to access these components.
Innovation Solution
A GOA circuit module design featuring transparent conductive portions made of Indium Tin Oxide (ITO) that can be electrically connected to exposed gate layers via vias, allowing for non-invasive testing of TFT characteristics and output signals without damaging the panel, using laser welding and a testing pad structure to isolate and reconnect signal lines for efficient defect analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional testing methods are used to test output signals from the GOA circuit, then testing can be performed, but the color filter substrate must be damaged by prying a corner away, which reduces success rate and may damage the GOA circuit
Solution Approach 1:
The patent segments the testing process by providing separate testing pads (first testing pad for gate line signals, second testing pad for source line signals) that are electrically connected to different parts of the GOA circuit through isolated paths. This allows independent testing of various circuit components without physically damaging the panel, replacing the conventional method of prying away the color filter substrate.
Solution Approach 2:
The patent introduces testing pads and testing signal lines as intermediary elements between the external testing equipment and the GOA circuit. These intermediaries provide access to internal circuit signals without requiring physical damage to the panel, thereby maintaining panel integrity while enabling comprehensive testing.
2Measurement precision
If mask designs are optimized for display performance, then display quality is improved, but it becomes difficult to test individual TFT characteristics and output signals in the parsing process
Solution Approach 1:
The patent divides the testing function into multiple dedicated testing pads (first testing pad, second testing pad, third testing pad) that can independently access different circuit nodes. This segmentation allows precise measurement of individual TFT characteristics and output signals without requiring complex mask designs, as each testing pad serves a specific testing purpose.
Solution Approach 2:
The testing pads are designed to serve multiple testing functions. For example, the first testing pad can be used to test both gate line signals and individual TFT characteristics through different connection configurations. This multi-functionality reduces the need for separate specialized structures, simplifying the overall mask design while maintaining comprehensive testing capability.
3Ease of manufacture
If the GOA circuit is integrated onto the array substrate to reduce costs and narrow rims, then manufacturing cost and rim width are reduced, but testing and defect analysis become more difficult
Solution Approach 1:
The patent extends the testing access from the traditional edge-based approach (prying away color filter) to a surface-based approach by placing testing pads throughout the array substrate. This dimensional shift allows testing signals to be applied and measured from the front surface of the panel, maintaining the integrated GOA circuit design while enabling easy access for testing without increasing rim width or manufacturing complexity.
Solution Approach 2:
The testing pads act as intermediaries that bridge the integrated GOA circuit and external testing equipment. These pads are formed using the same thin-film transistor fabrication processes as the display circuit itself, maintaining manufacturing simplicity while providing dedicated access points for comprehensive testing and defect analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables effective testing of TFTs and output signals within the GOA circuit module, increasing the success rate and reducing panel damage during testing, thus improving the efficiency and accuracy of defect identification and reducing manufacturing costs.
Implementation Method 1
Each of the plurality of the first transparent conductive portions is provided at its corresponding via, electrically isolated from the gate layer, and constructed to be electrically connectable to the portion of the gate layer as exposed by its corresponding via by means of welding
Data Source
AI summary
The present disclosure provides a Gate On Array (GOA) circuit module, comprising: a plurality of Thin Film Transistors (TFTs), each comprising a gate layer and a gate insulation layer laminated on a substrate, a plurality of vias each provided in the gate insulation layer to expose a portion of the gate layer, and a plurality of first transparent conductive portions each corresponding to one of the plurality of vias, each of the plurality of the first transparent conductive portions being provided at its corresponding via, electrically isolated from the gate layer, and constructed to be electrically connectable to the portion of the gate layer as exposed by its corresponding via by means of welding. The present disclosure also provides a method for testing the GOA circuit module, a display panel comprising the GOA circuit module and a display apparatus.