Goniometer-Based Grain Boundary Orientation Measurement

The patent introduces a goniometer as an intermediary device between the specimen and the detection system. The goniometer provides a known reference frame with precise angular positioning capabilities, serving as a mediator that eliminates the need to establish reference coordinates on the Kikuchi pattern film itself. This intermediary device transfers the measurement reference from the complex film analysis to the simpler, more precise goniometer readings.

The patent replaces the mechanical process of manually establishing reference coordinates on film with an automated goniometer system that provides digital angular measurements. The goniometer's encoded scales and motorized positioning replace the manual mechanical operations that introduced errors, providing more precise and repeatable measurements through electronic readout rather than manual film analysis.

The patent enables continuous real-time measurement by coupling the goniometer directly to the transmission electron microscope's detection system. As the specimen is tilted continuously or in discrete steps using the goniometer, the diffraction patterns are captured and analyzed immediately, providing continuous feedback on grain boundary characteristics without the time loss associated with film preparation and analysis.

The patent creates a digital copy of the diffraction pattern information that can be immediately processed and analyzed. Instead of requiring physical film development and manual measurement, the diffraction patterns are captured as digital images by a detector, allowing for immediate computational analysis and real-time results.