Graphene Quality Evaluation Using Confocal Laser Scanning Microscopy

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Solution Overview

Problem

Conventional methods for evaluating graphene quality, such as optical microscopy and Raman spectroscopy, are time-consuming and unsuitable for real-time quality control of graphene synthesized by chemical vapor deposition, especially in large-area roll-to-roll processes.

Innovation Solution

A method using a confocal laser scanning microscope to irradiate a graphene layer, detect reflected light signals, form a planar image, and analyze the contrast between graphene and the catalyst layer, enabling real-time evaluation of graphene quality during continuous synthesis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If optical microscope or Raman spectrum is used to evaluate graphene quality, then measurement precision is improved, but productivity deteriorates due to time-consuming evaluation process

Engineering Contradiction:
Improvegraphene quality evaluation accuracyVSAvoidevaluation speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent replaces conventional optical microscopy and Raman spectroscopy with a novel optical evaluation method based on light reflection and interference patterns. This substitution enables real-time quality assessment during continuous graphene synthesis, transforming the evaluation from a post-processing step to an in-line monitoring process that maintains both precision and high productivity

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent implements preliminary quality evaluation by analyzing optical contrast patterns during the graphene growth process itself, before the synthesis is complete. This allows defective areas to be identified early, enabling real-time process adjustment and preventing waste of resources on faulty batches

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If dark field optical microscopy is used to evaluate graphene, then measurement precision is improved for height-differentiated samples, but loss of time increases due to long exposure requirements

Engineering Contradiction:
Improvegraphene detection accuracyVSAvoidimage formation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces dark field microscopy with a reflection-based optical evaluation method that captures graphene contrast through light reflection differences between graphene-covered and exposed catalyst areas. This eliminates the need for long exposure times while maintaining detection precision

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If conventional evaluation methods are used, then measurement precision is improved, but device complexity increases due to requirement of specialized equipment and conditions

Engineering Contradiction:
Improvequality evaluation accuracyVSAvoidevaluation system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent creates a universal evaluation system using standard confocal laser scanning microscopy that can assess graphene quality across different synthesis methods (CVD, PVD, sputtering) and catalyst types. This multi-functional approach reduces device complexity by replacing multiple specialized equipment requirements with a single versatile platform

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for rapid and effective quality assessment of graphene in real-time, even in large-area roll-to-roll processes, improving efficiency and reducing production costs by identifying defective areas before further processing.

Implementation Method 1

detecting a signal of light reflected from the graphene layer

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

irradiating with laser light a graphene layer formed on a catalyst layer

Methodology Applied
Scientific EffectLaser: Laser

Data Source

PatentUS11933955B2Method for evaluating quality of graphene
Publication Date: 2024.03.19 GRAPHENE SQUARE INC
  • US11933955B2 patent drawing
  • US11933955B2 patent drawing
  • US11933955B2 patent drawing

AI summary

A method of evaluating quality of graphene using a confocal laser scanning microscope, the method comprising steps of: irradiating with laser light a graphene layer formed on a catalyst layer; detecting a signal of light reflected from the graphene layer; forming a planar image of the graphene layer using the detected optical signal; and analyzing a contrast between graphene and the catalyst layer in the planar image, wherein the graphene layer is continuously formed on the catalyst layer by a roll-to-roll process.