Grating-Based X-Ray Imaging for Material Recognition
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Solution Overview
Problem
Existing X-ray imaging systems face challenges with false alarms and incorrect recognition due to energy spectrum overlap, leading to a need for more precise and rapid material recognition in security checks.
Innovation Solution
An X-ray imaging system comprising an X-ray source, sequentially arranged gratings, and a detector, controlled by a controller and data processing device to generate phase contrast and dark field information for obtaining CT images, which enables more precise material recognition through Digital Radiography (DR) scans and CT scans at positions of interest.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional X-ray transmission imaging is used for security check, then the imaging process is simple and fast, but material recognition accuracy deteriorates due to energy spectrum overlap
Solution Approach 1:
The patent segments the X-ray imaging process into multiple scanning modes (transmission scan, phase contrast scan, dark field scan) that can be selectively applied. The grating-based imaging system is segmented into source grating, object grating, and analyzer grating components. This segmentation allows the system to use simple transmission imaging for routine checks while switching to complex grating-based modes only when material recognition accuracy is needed, thus resolving the contradiction between accuracy and complexity.
Solution Approach 2:
The patent implements dynamic switching between different imaging modes based on the inspection requirements. The system can dynamically adjust whether to perform transmission scanning, phase contrast scanning, or dark field scanning, and can dynamically adjust grating positions and orientations. This dynamic adaptability allows the system to maintain simplicity for routine inspections while achieving high accuracy when needed.
2Measurement precision
If CT scan is performed on the entire object to improve material recognition, then accuracy improves, but inspection time increases significantly
Solution Approach 1:
The patent performs preliminary transmission scanning to obtain basic attenuation information and identify regions of interest before performing more time-consuming phase contrast or dark field scans. By pre-identifying suspicious areas through quick transmission imaging, the system avoids performing comprehensive high-accuracy scanning on the entire object, thus reducing total inspection time while maintaining accuracy for critical areas.
Solution Approach 2:
Instead of performing full CT scanning on the entire object, the patent applies phase contrast and dark field imaging techniques selectively to specific regions of interest identified in preliminary scans. This partial application of advanced imaging techniques achieves sufficient material recognition accuracy for the most suspicious areas without the time penalty of comprehensive scanning of the entire object.
3Measurement precision
If grating-based phase contrast and dark field imaging are used, then material recognition ability improves, but device complexity and scanning time increase
Solution Approach 1:
The patent implements periodic scanning where transmission scans are performed frequently and quickly, while phase contrast and dark field scans using gratings are performed less frequently or only on regions of interest. This periodic application of complex imaging techniques maintains productivity by using simple fast scanning for routine inspections while still achieving high material recognition accuracy when gratings are deployed strategically.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system achieves improved accuracy and speed in material recognition by deriving internal features from phase contrast and dark field information, allowing for precise identification of objects and detection of dangerous articles.
Implementation Method 1
Existing X-ray imaging systems detect internal structures of an object in a non-destructive way based on attenuation properties of materials to X-rays
Implementation Method 2
control the detector to receive X-ray beams passing through the first grating and the second grating to generate phase contrast information
Implementation Method 3
a first grating and a second grating arranged sequentially in an irradiation direction of the X-ray beams
Data Source
AI summary
An X-ray imaging system and method are provided. The system may include: an X-ray source configured to irradiate X-ray beams; a first grating and a second grating arranged sequentially in an irradiation direction of the X-ray beams; a detector arranged at downstream of the second grating in the irradiation direction; and a controller and data processing device configured to control the X-ray source to irradiate the X-ray beams, to control the detector to receive X-ray beams passing through the first grating and the second grating to generate phase contrast information and/or dark field information, and to perform CT check on an object under check based on the phase contrast information and/or the dark field information to obtain a CT image. In this way, it is possible to obtain more characteristic information about the object under check, so as to achieve more precise material recognition and security check.