GridTape Aperture Structure for Automated TEM Sample Collection

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Solution Overview

Problem

Current TEM sample collection methods are laborious and error-prone, particularly for nano-scale electron-transparent substrates, and lack compatibility with automated sample handling techniques.

Innovation Solution

A TEM-compatible tape substrate with a trough-shaped configuration and electron-lucent support film, featuring apertures covered by the film, allowing for automated sample collection and handling, and enabling efficient imaging in TEM systems.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual techniques are used to collect samples onto separate imaging substrates, then the integrity of nano-scale electron-transparent substrates is maintained, but the process becomes laborious and time-consuming

Engineering Contradiction:
Improveintegrity of substrateVSAvoidtime for sample collection
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The continuous substrate is divided into multiple discrete imaging areas with apertures, allowing samples to be collected and imaged in organized segments while maintaining the continuous nature of the substrate for automated handling

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A support film is introduced as an intermediary layer over the apertures to provide mechanical strength and protect the thin substrate, enabling automated handling without compromising substrate integrity

Inventive Principle:
Principle #24Intermediary (Mediator)

2Extent of automation

If tape-based substrate is covered to produce tape sandwich, then automated sample collection becomes possible, but the process becomes error-prone

Engineering Contradiction:
Improveautomated sample collectionVSAvoidaccuracy of sample collection
Core Design Contradiction:
Extent of automationVSReliability

Solution Approach 1:

The support film is pre-positioned over the apertures before sample collection, creating a prepared substrate that guides automated sample placement and reduces errors during the collection process

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The thin support film provides a flexible yet protective covering that maintains substrate integrity during automated handling while allowing precise sample positioning through its aperture structure

Inventive Principle:
Principle #30Flexible shells and thin films

3Strength

If electron-lucent support film is attached over apertures, then structural integrity is maintained, but the complexity of substrate configuration increases

Engineering Contradiction:
Improvestructural integrity of substrateVSAvoidcomplexity of substrate configuration
Core Design Contradiction:
StrengthVSDevice complexity

Solution Approach 1:

The support film is integrated directly with the continuous substrate, merging two components into a unified structure that provides both mechanical strength and aperture functionality without requiring separate assembly steps

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20240402059A1GridTape For Fast Nanoscale Imaging
Publication Date: 2024.12.05 PRESIDENT & FELLOWS OF HARVARD COLLEGE
  • US20240402059A1 patent drawing
  • US20240402059A1 patent drawing
  • US20240402059A1 patent drawing

AI summary

A tape for collecting tissue samples in a manner compatible with imaging in a transmission electron microscopy (TEM) system, includes a tape substrate having two side walls forming a trough. The trough is defined by a bottom surface of the tape substrate and internal surfaces of the side walls, with an open side therebetween. A support film is attached to a top surface of the tape substrate, and a plurality of apertures is spaced at predetermined locations along the length of the tape substrate, each aperture being covered by the support film. The tape includes a stacked configuration in which the tape substrate is wound in layers, the bottom surfaces of the side walls in one layer being in contact with the support film in an immediately adjacent layer. The apertures in the second layer are aligned within the trough of the first layer, between the side walls.