Grooved Pellicle Frame for Lithography Mask Pressure Balance

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Solution Overview

Problem

Existing mask pellicle systems in photolithography processes face issues with pressure differential balancing, leading to membrane distortion, wrinkling, or breakage, which can render the system unusable, due to inadequate protection against particles and pressure differences.

Innovation Solution

A pellicle frame with strategically designed grooves on its surface is used to secure a thin membrane, preventing particle contamination and maintaining pressure balance, thereby enhancing the durability and functionality of the mask pellicle system.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If a thin membrane is used to protect the mask from particles, then particle protection is improved, but the membrane becomes susceptible to distortion, wrinkling, or breakage due to pressure differential

Engineering Contradiction:
Improveparticle protectionVSAvoidmembrane integrity
Core Design Contradiction:
Object-affected harmful factorsVSReliability

Solution Approach 1:

The pellicle frame incorporates grooves at specific locations to create localized pressure equalization zones. These grooves are strategically positioned to allow pressure differential balancing at critical points while maintaining overall membrane protection, thus preventing distortion and breakage without compromising particle protection.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The grooves in the pellicle frame act as intermediary structures that mediate between the internal and external pressure environments. By providing controlled pathways for pressure equalization, the grooves protect the membrane from excessive pressure differential while maintaining the protective enclosure against particles.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Object-affected harmful factors

If the pellicle frame is made completely sealed to protect against particles, then particle protection is improved, but pressure differential cannot be balanced, leading to membrane failure

Engineering Contradiction:
Improveparticle protectionVSAvoidpressure differential
Core Design Contradiction:
Object-affected harmful factorsVSStress or pressure

Solution Approach 1:

The pellicle frame incorporates grooves at specific locations to create localized pressure equalization zones. These grooves are strategically positioned to allow pressure differential balancing at critical points while maintaining overall membrane protection, thus preventing distortion and breakage without compromising particle protection.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The grooves in the pellicle frame create a controlled porous structure that allows pressure equalization while maintaining particle protection. The groove geometry is designed to permit gas or vapor passage for pressure balancing while being sufficiently small or configured to trap particles, thus resolving the contradiction between sealing and pressure equalization.

Inventive Principle:
Principle #31Porous materials

3Reliability

If grooves are added to the pellicle frame for pressure balancing, then membrane integrity is improved, but device complexity increases

Engineering Contradiction:
Improvemembrane integrityVSAvoidpellicle frame structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The pellicle frame is segmented into regions with and without grooves, allowing pressure equalization only at specific locations. This segmentation approach maintains membrane integrity through targeted pressure balancing while minimizing the overall structural complexity by limiting grooves to necessary areas rather than implementing a complex grooved pattern throughout.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS10691017B2Pellicle for advanced lithography
Publication Date: 2020.06.23 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10691017B2 patent drawing
  • US10691017B2 patent drawing
  • US10691017B2 patent drawing

AI summary

Pellicle-mask systems for advanced lithography, such as extreme ultraviolet lithography, are disclosed herein. An exemplary pellicle-mask system includes a mask having an integrated circuit (IC) pattern, a pellicle membrane, and a pellicle frame. The pellicle frame has a first surface attached to the pellicle membrane and a second surface opposite the first surface attached to the mask, such that the IC pattern of the mask is positioned within an enclosed space defined by the mask, the pellicle membrane, and the pellicle frame. A void is defined between the pellicle frame and the mask, where the void is defined by a portion of the second surface of the pellicle membrane not attached to the mask. The void is not in communication with the enclosed space and is not in communication with an exterior space of the pellicle-mask system.