Group-Based Defect Detection Configuration for Uniform Structure Inspection
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Solution Overview
Problem
Existing defect detection methods for structures like bridges and tunnels lack uniformity in inspection criteria, leading to variations in quality across different inspection workers and organizations.
Innovation Solution
An information processing apparatus that determines a user's group affiliation to apply appropriate defect detection processing configurations based on acquired information, enabling uniformity by sharing and managing configurations within and between organizations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If visual inspection by inspection workers is used, then flexibility and adaptability to different inspection needs are maintained, but quality uniformity and consistency across different workers and organizations deteriorate
Solution Approach 1:
The patent applies parameter changes by allowing inspection conditions (such as threshold values, processing parameters, and detection criteria) to be varied according to the type of structure being inspected (tunnel, bridge, etc.), while maintaining a unified automated inspection framework. This enables both adaptability to different inspection needs and uniformity in execution quality across different users and organizations.
2Manufacturing precision
If automated defect detection using image processing is implemented, then quality uniformity and inspection consistency are improved, but the complexity of configuring and managing inspection criteria across different users and organizations increases
Solution Approach 1:
The patent segments the inspection system into distinct components: user group definitions, inspection condition templates, and execution layers. By dividing the system into these manageable segments, different users and organizations can be assigned to specific groups with pre-configured inspection conditions, reducing the complexity of managing automated defect detection across diverse users while maintaining quality uniformity.
Solution Approach 2:
The patent creates universal inspection condition templates that can be applied across multiple users and organizations. These templates define standard inspection criteria that can be reused and adapted for different structure types (tunnels, bridges), reducing configuration complexity while ensuring consistent quality standards are applied universally across the system.
3Adaptability or versatility
If inspection criteria are customized for each user and organization, then adaptability to specific needs is improved, but the time and resources required for configuration and management increase
Solution Approach 1:
The patent implements preliminary action by pre-defining user groups and their associated inspection conditions before actual inspection tasks are performed. Inspection templates and criteria are prepared in advance for different structure types and user roles, so when a user performs an inspection, the appropriate configuration is automatically applied without requiring time-consuming custom setup, thus reducing configuration time while maintaining adaptability.
Data Source
AI summary
An information processing apparatus determines a group to which a user belongs. The user requests defect detection processing on an image of a structure, the information corresponding to the determined group to which the user belongs, and executes the defect detection processing on the image based on a particular configuration. The information refers to a storage that manages the information to be used in the configuring in association with a plurality of groups in which a user group that can use the information to be used in configuring the defect detection processing in a first mode when setting the configuration of the defect detection processing and in association with a user group that can use the information to be used in configuring the defect detection processing in a second mode different from the first mode when setting the configuration of the defect detection processing.