Guard Ring Structure for Parasitic Current Blocking in Semiconductor Devices

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Solution Overview

Problem

Semiconductor systems face issues with parasitic bipolar transistors causing noise and latch-up due to parasitic current, leading to circuit failures and current leakage, which existing technologies have not adequately addressed.

Innovation Solution

The implementation of a semiconductor device with a guard ring structure, including multiple guard rings of different conductivity types surrounding a transistor, where the guard rings receive specific biases to form potential barriers that impede carrier movement and stabilize the device operation by blocking parasitic bipolar transistor currents.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If a power transistor is used to transmit power in a semiconductor system, then power transmission capability is improved, but parasitic bipolar transistors generate parasitic current causing noise and latch-up

Engineering Contradiction:
Improvepower transmission capabilityVSAvoidparasitic current
Core Design Contradiction:
PowerVSObject-generated harmful factors

Solution Approach 1:

Guard rings are introduced as intermediary structures between the power transistor and surrounding circuits. These guard rings act as mediators that intercept and redirect parasitic current before it can cause harmful effects, thereby resolving the contradiction between maintaining power transmission capability and eliminating parasitic current generation

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If guard rings are added around the transistor to block parasitic current, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvedevice stabilityVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The guard rings are configured with specific conductivity types (first conductivity type for the first guard ring, second conductivity type for the second guard ring) and assigned specific bias voltages (first bias and second bias respectively). By changing the electrical parameters (conductivity type and bias voltage) rather than merely adding structural elements, the patent achieves reliable parasitic current blocking while maintaining relatively simple device structure

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration effectively reduces the gain of parasitic bipolar transistors, preventing unwanted current flow and ensuring stable operation of the semiconductor device by creating potential barriers that capture and redirect carriers, thereby preventing latch-up and noise interference.

Implementation Method 1

the guard rings receive specific biases to form potential barriers that impede carrier movement and stabilize the device operation by blocking parasitic bipolar transistor currents

Methodology Applied
Scientific EffectPotential barrier: Potential Well

Data Source

PatentUS9385185B2Semiconductor devices including a guard ring and related semiconductor systems
Publication Date: 2016.07.05 SAMSUNG ELECTRONICS CO LTD
  • US9385185B2 patent drawing
  • US9385185B2 patent drawing
  • US9385185B2 patent drawing

AI summary

Semiconductor devices are provided. The semiconductor devices may include a substrate and a transistor on the substrate. The semiconductor devices may include a first guard ring of first conductivity type in the substrate adjacent the transistor. The semiconductor devices may include a second guard ring of second conductivity type opposite the first conductivity type in the substrate adjacent the first guard ring. Related semiconductor systems are also provided.