Guide Rail Jig for Mounting Brittle Samples in Ion Milling
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Solution Overview
Problem
Handling brittle samples with tweezers for ion milling can lead to damage and is difficult, especially when attaching them to a sample holder in an ion milling apparatus.
Innovation Solution
A jig with a holder support portion, guide assembly, and elevating and lowering mechanism is used to mount samples on a sample holder, allowing the sample to be placed without direct gripping, using a slider assembly to move along rails and ensure precise positioning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If tweezers are used to handle and mount the sample on the sample holder, then the mounting operation can be performed, but the brittle sample may be damaged or destroyed
Solution Approach 1:
The patent introduces a jig as an intermediary device between the operator and the brittle sample. The jig includes a holder support portion and a guide assembly with rails and a slider assembly, which together provide a controlled environment for mounting the sample without direct manual handling. This mediator allows the sample to be transferred and positioned using mechanical guidance rather than direct gripping with tweezers, thus preventing damage while maintaining ease of operation.
2Productivity
If tweezers are used to grip the sample, then the sample can be manipulated, but handling becomes difficult and time-consuming
Solution Approach 1:
The jig serves as a mediator that simplifies the handling process. The guide assembly with rails and slider provides a straightforward mechanical path for moving the sample, eliminating the complexity of precise tweezers manipulation. This intermediary mechanism makes the operation easier and more efficient by providing guided motion rather than requiring skilled manual dexterity.
Solution Approach 2:
The jig divides the mounting operation into distinct functional components: the holder support portion for stable positioning, the rails for guided linear motion, and the slider assembly for controlled sample transfer. This segmentation of the handling process into simple, dedicated elements improves both ease of operation and productivity by making each step straightforward and repeatable.
Data Source
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AI summary
There is provided a jig which permits a sample to be mounted on a sample holder easily. The jig (100) is used to mount the sample (S) on the sample holder (200) that is used for an ion milling apparatus which mills the portion of the sample (S) protruding from a shielding material (210) by irradiating the sample (S) with an ion beam via the shielding material (210). The jig (100) includes: a holder support portion (20) providing support of the sample holder (200) on which the shielding material (210) is mounted; and a guide assembly (30) having rails (34) and a slider assembly (32) capable of moving along the rails (34) and operative to move the sample (S) to the sample holder (200).