Hall Sensor Error Detection with NAND NOR Gates
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Solution Overview
Problem
Hall sensors in practical use suffer from undesirable offset voltages due to production tolerances and mechanical stresses, which can lead to malfunction, especially in applications like motor vehicles where a single failure can cause system malfunctions if not recognized and compensated.
Innovation Solution
Incorporating a NAND gate and NOR gate connected to the Hall sensor element's connection locations to detect errors by outputting logical error signals based on voltage levels, and using multiplexers to apply the exciter current in different directions for offset compensation according to the spinning Hall principle.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the Hall sensor element is produced as an integrated circuit with supply source and signal processing electronics, then the Hall sensor can be compact and functional, but production tolerances and mechanical stresses cause offset voltages that lead to potential malfunction
Solution Approach 1:
The patent applies preliminary action by implementing error detection logic that proactively identifies impermissible operating states before they cause malfunction. The NAND gate continuously monitors the potentials at connection locations and generates error signals in advance, allowing the system to compensate for offset voltages before they lead to failure.
Solution Approach 2:
The patent implements feedback by using the error signal from the NAND gate to trigger compensation measures. When the NAND gate detects an impermissible operating state (both inputs at supply voltage potential), it outputs an error signal that can be used to compensate for offset voltages, creating a closed-loop feedback system that maintains reliability.
2Reliability
If error detection and compensation measures are implemented to prevent malfunction, then reliability is improved, but the device complexity and cost increase
Solution Approach 1:
The patent applies universality by designing the NAND gate to serve multiple functions: it monitors the operating state of the Hall sensor element, detects impermissible conditions, and generates error signals for compensation. This multi-functional approach achieves reliable error detection without adding significant complexity, as the same logical unit performs multiple protective roles.
Solution Approach 2:
The patent implements self-service by enabling the Hall sensor to self-diagnose its own operating state through the NAND gate monitoring system. The sensor effectively monitors itself for impermissible conditions and can trigger its own compensation mechanisms, reducing the need for external complex monitoring systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables simple detection and display of errors in Hall sensors, enhancing reliability by providing error signals that indicate impermissible operating states and allowing for compensation of offset voltages, thus preventing malfunctions.
Implementation Method 1
the Lorentz force acts on the moving electrons of the current, which force deflects the electrons transverse to their movement direction in the plate plane
Implementation Method 2
an electrical field builds up in the Hall sensor element, transverse to the current direction, which field can be tapped as an electrical voltage between the connection locations that are not connected with the supply connectors. This voltage is called a Hall voltage
Data Source
AI summary
A Hall sensor has a Hall sensor element, having multiple connection locations and a current supply source or voltage supply source, which has a first and a second supply connector for output of a supply current or a supply voltage. The first supply connector is connected or can be connected with a first connection location to feed a current into the Hall sensor element, and the second supply connector is connected or can be connected with a second connection location of the Hall sensor element. The Hall sensor has a NAND gate, which is connected with the first connection location of the Hall sensor element using a first input, and with the second connection location of the Hall sensor element using a second input, and has an output for output of a first error signal. Alternatively or in addition to the NAND gate, the Hall sensor can have a NOR gate, which is connected with the third connection location using a first input connector, and with the fourth connection location using a second input connector, and has an output connector for output of a second error signal.