Silicon Hall Sensor Offset Compensation via Polysilicon Coils

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Solution Overview

Problem

Hall-effect sensors face challenges in accuracy and precision due to intrinsic effects like offset and manufacturing variations, as well as variable factors such as temperature changes, current bias, mechanical stress, and aging, which affect their magnetic field measurements.

Innovation Solution

The proposed solution involves orienting Hall sensors along specific crystallographic directions, using a dielectric layer and polysilicon shielding to reduce offset and flicker noise, and employing compensating coils to mitigate systematic biases, along with a dual-dual configuration of Hall sensors to enhance measurement precision and stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If Hall sensors are used for magnetic field measurement, then measurement capability is provided, but offset and drift cause measurement precision degradation

Engineering Contradiction:
Improvemeasurement precisionVSAvoidoffset and drift
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The sensor system is divided into multiple Hall sensors arranged in a dual-dual configuration, where each sensor is independently measured and processed. This segmentation allows for individual offset characterization and compensation, reducing the impact of offset and drift on overall measurement precision.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Offset and drift parameters are characterized under specific test conditions (temperature, magnetic field) and then compensated by adjusting measurement parameters. The system dynamically adjusts measurement parameters based on characterized offset behavior to maintain precision across varying operating conditions.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If compensating coils are added to reduce offset, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Multiple Hall sensors are merged into a dual-dual configuration where their outputs are combined through differential measurement. This merging approach provides offset cancellation and improved precision without requiring separate compensating coils for each sensor, thus avoiding excessive device complexity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system implements feedback through dynamic offset compensation algorithms that continuously monitor and adjust for offset and drift based on characterized behavior. This feedback mechanism maintains measurement precision without requiring additional hardware complexity beyond the sensor array and processing circuitry.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If multiple Hall sensors are used in dual-dual configuration, then measurement precision is enhanced, but manufacturing complexity increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoidmanufacturing precision
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The dual-dual sensor configuration serves multiple functions simultaneously: it provides the primary measurement capability, enables offset cancellation through differential measurement, and allows for redundancy. This multi-functionality justifies the increased manufacturing complexity by delivering superior measurement precision and reliability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system compensates for manufacturing variations by characterizing offset parameters under controlled conditions and then applying software-based corrections. This approach allows standard manufacturing processes to be used while achieving high measurement precision through post-fabrication parameter adjustment and compensation.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively reduces measurement offset and increases the usable bandwidth of Hall sensors, maintaining sensitivity while compensating for drift and aging-related inaccuracies, thereby improving the overall precision and reliability of magnetic field measurements.

Implementation Method 1

a first coil is located over the first doped region in an interconnect level, and a second coil is located over the second doped region in the interconnect level. The first coil is configured to produce in response to a current a first magnetic moment with a first direction, and the second coil is configured to produce in response to the current a second magnetic moment with a second direction opposite the first direction

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Implementation Method 2

Hall-effect sensors face challenges in accuracy and precision due to intrinsic effects like offset and manufacturing variations

Methodology Applied
Scientific EffectHall effect: Hall Effect

Data Source

PatentUS11899082B2Silicon hall sensor with low offset and drift compensation coils
Publication Date: 2024.02.13 TEXAS INSTRUMENTS INC
  • US11899082B2 patent drawing
  • US11899082B2 patent drawing
  • US11899082B2 patent drawing

AI summary

An integrated circuit includes a doped region having a first conductivity type formed in a semiconductor substrate having a second conductivity type. A dielectric layer is located between the doped region and a surface plane of the semiconductor substrate, and a polysilicon layer is located over the dielectric layer. First, second, third and fourth terminals are connected to the doped region, the first and third terminals defining a conductive path through the doped region and the second and fourth terminals defining a second conductive path through the doped region, the second path intersecting the first path.