Integrated Hall Sensor Current Measurement in Semiconductor Transistors
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Solution Overview
Problem
Existing semiconductor arrangements for current measurement in transistors suffer from power losses due to shunt resistors and measurement transistors, which can also incur losses during operation.
Innovation Solution
A semiconductor arrangement integrating a transistor and a Hall sensor within a common semiconductor body, where the Hall sensor measures current by sensing the magnetic field induced by the transistor's current flow, minimizing losses and allowing for low-power current measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a shunt resistor is connected in series with the transistor to measure current, then current measurement is achieved, but power losses occur
Solution Approach 1:
The patent replaces the traditional electrical measurement method (shunt resistor) with a magnetic field-based measurement method. The Hall sensor detects the magnetic field generated by the current flowing through the transistor, converting an electrical measurement problem into a magnetic field detection problem. This substitution eliminates the need for current to pass through a resistive element, thereby avoiding power losses while maintaining measurement capability.
Solution Approach 2:
The patent introduces a magnetic field as an intermediary between the current-carrying transistor and the measurement device. Instead of directly measuring current through electrical contact (which causes power loss), the Hall sensor measures the magnetic field generated by the current. This magnetic field intermediary allows indirect measurement without direct electrical interaction that would cause energy dissipation.
2Measurement precision
If a measurement transistor is provided to measure load current, then current measurement is achieved, but losses occur during operation
Solution Approach 1:
The patent replaces the measurement transistor approach with a Hall sensor-based magnetic field detection system. Instead of using another active semiconductor device that would require bias currents and operate in specific regions (causing power consumption), the Hall sensor passively detects the magnetic field generated by the load current. This eliminates the need for additional active measurement components and their associated power losses.
3Loss of energy
If a Hall sensor is integrated in the same semiconductor body as the transistor, then measurement losses are minimized, but device complexity increases
Solution Approach 1:
The patent combines the power transistor and Hall sensor into a single integrated semiconductor device structure. The Hall sensor is formed in the same semiconductor body as the transistor, with shared substrates and integration processes. This merging reduces the need for separate discrete components and interconnections, thereby minimizing measurement losses while managing complexity through unified device architecture.
Solution Approach 2:
The integrated semiconductor structure serves multiple functions: the transistor provides power switching capability while the Hall sensor provides current measurement capability. Both functions are embedded within the same device, allowing simultaneous power delivery and measurement without requiring separate external components. This multi-functionality approach addresses complexity by consolidating rather than multiplying components.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables precise current measurement with minimal power loss, as the Hall sensor directly measures the current through the transistor, reducing energy consumption and maintaining high efficiency even at high temperatures.
Implementation Method 1
at least one Hall sensor arranged in the semiconductor body at a distance from the semiconductor device in a second direction perpendicular to the first direction
Data Source
AI summary
A semiconductor arrangement includes a semiconductor body and a semiconductor device, the semiconductor device including first and second load terminals arranged distant to each other in a first direction of the semiconductor body and a load path arranged in the semiconductor body between the first and second load terminals. The semiconductor arrangement further includes at least one Hall sensor arranged in the semiconductor body distant to the semiconductor device in a second direction perpendicular to the first direction. The Hall sensor includes two current supply terminals and two measurement terminals.