Halo Test Method for Optical Chip Using Spherical Coordinate Transformation
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Solution Overview
Problem
Conventional methods for testing optical chips in integrated circuits fail to detect halo faults due to their reliance on row, column, and block-based algorithms, which do not account for pixel units with halo characteristics.
Innovation Solution
A halo test method that irradiates a light-sensing array with a controlled light source, processes the pixel data into circular patterns, and uses adjacent difference calculations to determine if the halo test is successful by comparing the maximum absolute value against a standard.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional row, column, and block-based algorithms are used for testing optical chips, then the testing method is simple and well-developed, but halo faults cannot be detected
Solution Approach 1:
The patent applies spherical geometry by converting the traditional two-dimensional row-column array into a three-dimensional spherical coordinate system. Pixels are重新organized based on their angular positions (azimuth and elevation angles) relative to the center of the light-sensing array, forming a spherical distribution pattern that naturally captures halo characteristics radiating from the center.
Solution Approach 2:
The patent introduces a new dimensional perspective by transforming the flat two-dimensional array data into a three-dimensional spherical coordinate system. This dimensionality change allows the testing algorithm to detect halo patterns that radiate outward from the center in all directions, which are invisible in the traditional row-column-block framework.
2Measurement precision
If the light-sensing array is irradiated by vertical and uniform light, then each pixel output is uniformly distributed, but pixels in the middle have high light sensitivity and pixels at the edge have low light sensitivity
Solution Approach 1:
The patent applies local quality by assigning different weights to pixels based on their positions in the spherical coordinate system. Central pixels (closer to the optical axis) receive different weighting than edge pixels, compensating for the inherent sensitivity variations and achieving uniformized measurement results across the entire array.
Solution Approach 2:
The patent changes the coordinate system parameters from Cartesian (row, column) to spherical (azimuth angle, elevation angle, radius), fundamentally altering how pixel positions are represented and processed. This parameter transformation enables the system to naturally account for the radial sensitivity gradient from center to edge.
3Reliability
If pixel units with halo are analyzed using traditional row, column, or region algorithms, then the testing process remains simple, but the halo fault cannot be detected because these pixels do not have maximum or minimum values in rows, columns or regions
Solution Approach 1:
By organizing pixels in a spherical distribution pattern, the patent creates radial sectors that naturally capture halo patterns emanating from the center. In this spherical framework, halo-affected pixels exhibit distinct angular concentration patterns that are detectable through statistical analysis of angular distributions, even though they don't show up as extrema in traditional linear rows or columns.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Effectively detects halo faults in optical chips without additional hardware costs, overcoming the limitations of existing algorithms by analyzing pixel units in circular patterns.
Implementation Method 1
a light-sensing array (for example, 208*160, 33280 pixels in total) of a chip to be tested is irradiated by a light source. Each pixel in the light-sensing array generates weak current according to different illuminance.
Data Source
AI summary
The present invention discloses a halo test method for an optical chip in an integrated circuit. A captured image array is processed as a circle by: dividing the array into circular patterns on the basis of the radius, reconstructing the circular patterns into a two-dimensional array according to coordinates, and then performing corresponding operations on the obtained array to obtain a desired value. By the halo test method for an optical chip in an integrated circuit provided in the present invention, without increasing any extra hardware cost and under the primary test conditions, the technical problem in the prior art that there is no well-developed method and algorithm for testing halo on a fingerprint on display (FOD) chip is solved.