Halogen Separation Layer for TFT Transfer to Flexible Substrates

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Solution Overview

Problem

The existing techniques for manufacturing thin film transistors (TFTs) on flexible plastic substrates face challenges such as equipment specificity, risk of solvent and plasma exposure damaging the plastic, heat resistance issues, and high costs due to the need for expensive sputtering targets and complex multi-layer processes.

Innovation Solution

A method involving a halogen-containing separation layer formed by plasma CVD, allowing for low-temperature detachment of TFTs from glass substrates to flexible plastic substrates, with a halogen element concentration gradient at the interface to facilitate cleavage, and optional buffer layers for stress relief and impurity blocking.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If TFTs are formed directly over plastic films, then flexibility is achieved, but the plastic film is exposed to solvents and etching gases causing quality degradation

Engineering Contradiction:
ImproveflexibilityVSAvoidplastic film quality
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The manufacturing process is segmented into two distinct stages: first forming TFTs on a glass substrate (which can withstand harsh processing), then separating and transferring the TFT layer to the plastic film. This segmentation protects the plastic film from direct exposure to damaging solvents and etching gases during TFT fabrication.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The glass substrate serves as an intermediary medium during the manufacturing process. It temporarily supports the TFT structure during fabrication with harsh chemicals, then the TFT layer is transferred to the plastic film. The glass substrate mediates between the harsh processing requirements and the sensitivity of the plastic film.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If TFTs are formed directly over plastic films, then flexibility is achieved, but plasma irradiation deforms the plastic film

Engineering Contradiction:
ImproveflexibilityVSAvoidplastic film deformation
Core Design Contradiction:
Adaptability or versatilityVSShape

Solution Approach 1:

The process is divided into separate stages where plasma-based sputtering is performed on glass substrate first, then the completed TFT layer is transferred to plastic film. This prevents plasma irradiation from directly affecting the plastic film, avoiding deformation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The glass substrate acts as a protective intermediary during plasma processing. It absorbs the plasma irradiation that would otherwise deform the plastic film, allowing TFT fabrication to proceed without shape distortion of the final flexible substrate.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of manufacture

If separation is performed using metal oxide layer, then detachment is achieved, but at least two layers must be formed increasing process complexity

Engineering Contradiction:
Improvedetachment capabilityVSAvoidnumber of layers
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The separation layer and the lower buffer layer are merged into a single integrated layer structure. The separation layer is formed with a halogen element concentration gradient that provides both the buffering function and the separation function, eliminating the need for distinct separate layers and simplifying the manufacturing process.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The separation layer's halogen element concentration is varied through its thickness to create a gradient profile. This parameter change enables the single layer to perform multiple functions: providing mechanical buffering during separation while also enabling clean detachment at the optimal interface location.

Inventive Principle:
Principle #35Parameter changes

4Ease of manufacture

If separation is performed using metal oxide layer, then detachment is achieved, but impurity diffusion into semiconductor layer occurs

Engineering Contradiction:
Improvedetachment capabilityVSAvoidsemiconductor layer purity
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The halogen element concentration in the separation layer is optimized to create a gradient profile with higher concentration near the glass substrate interface and lower concentration toward the TFT layer. This parameter optimization ensures effective separation while preventing impurity diffusion into the semiconductor layer, maintaining its purity and electrical characteristics.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach simplifies the manufacturing process, reduces costs, and enables reliable transfer of TFTs to flexible substrates without damaging the plastic, while preventing impurity diffusion and maintaining device quality.

Implementation Method 1

A method involving a halogen-containing separation layer formed by plasma CVD

Methodology Applied
Scientific EffectPlasma CVD: Plasma Enhanced Chemical Vapour Deposition

Implementation Method 2

with a halogen element concentration gradient at the interface to facilitate cleavage

Methodology Applied
Scientific EffectConcentration gradient: Density Gradient

Data Source

PatentUS8487342B2Semiconductor device and manufacturing method thereof
Publication Date: 2013.07.16 SEMICON ENERGY LAB CO LTD
  • US8487342B2 patent drawing
  • US8487342B2 patent drawing
  • US8487342B2 patent drawing

AI summary

A separation layer containing a halogen element is formed over a glass substrate by a plasma CVD method; a semiconductor element is formed over the separation layer; and separation is then performed inside the separation layer or at its interface, so that the large-area glass substrate and the semiconductor element are detached from each other. In order to perform detachment at the interface between the glass substrate and the separation layer, the separation layer may have concentration gradient of the halogen element, and the halogen element is contained more near the interface between the separation layer and the glass substrate than in the other areas.