Handler Change Kit for Radiated and Conductive Testing
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Solution Overview
Problem
Existing test systems, such as automatic test equipment (ATE), are limited in their ability to perform both conductive and radiated testing on electronic devices without requiring separate hardware configurations, leading to inefficiencies in testing time and cost.
Innovation Solution
A handler change kit that includes a receptacle and cap to form a housing around a device under test (DUT), isolating it physically or electromagnetically, and incorporating antennas for radiated testing, which can be integrated with a device interface board (DIB) to adapt it for radiated testing while maintaining conductive testing capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If separate hardware configurations are used for conductive and radiated testing, then testing capability is improved, but device complexity and cost increase
Solution Approach 1:
The test system is designed with universal hardware that can perform both conductive and radiated testing functions. The device interface board (DIB) and test sockets are configured to support multiple testing modes through software control and reconfigurable signal routing, eliminating the need for separate dedicated hardware systems for each testing type.
Solution Approach 2:
The patent combines conductive testing and radiated testing capabilities into a single integrated test system. The housing structure incorporates both conductive test sockets and radiated testing antennas within the same physical enclosure, allowing both testing functions to coexist and operate on the same device under test simultaneously or sequentially.
2Adaptability or versatility
If separate hardware configurations are used for conductive and radiated testing, then testing capability is improved, but testing time increases
Solution Approach 1:
The integrated test system enables continuous testing operations by allowing conductive and radiated testing to be performed without shutting down or reconfiguring hardware between test types. The system maintains persistent connections and signal paths for both testing modes, enabling seamless transitions and parallel operations that eliminate idle time.
Solution Approach 2:
The test system is pre-configured with all necessary components for both conductive and radiated testing already in place before testing begins. The housing, sockets, and antennas are pre-assembled and positioned to accommodate both testing types, eliminating setup and reconfiguration time that would otherwise be required between different testing modes.
3Ease of operation
If DUTs are tested without electromagnetic isolation, then testing simplicity is improved, but measurement precision deteriorates due to interference
Solution Approach 1:
The housing structure implements electromagnetic isolation through selectively positioned conductive shields and absorptive materials at specific locations where interference is most likely to occur. Rather than enclosing the entire housing in shielding material, targeted local shielding around sensitive test sockets and signal paths provides sufficient isolation while maintaining operational simplicity and avoiding excessive complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the same test system to perform both conductive and radiated testing without hardware changes, reducing testing time and cost by isolating DUTs electromagnetically and physically, allowing for simultaneous or sequential testing across different frequency bands.
Implementation Method 1
an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT
Implementation Method 2
The housing is for isolating the DUT at least one of physically or electromagnetically
Data Source
AI summary
An example system includes a receptacle to house a device under test (DUT); an antenna for exchanging signals with the DUT, where at least some of the signals are for use in performing radiated testing of the DUT; and a cap configured to mate to the receptacle to form a housing to enclose the DUT. The housing is for isolating the DUT at least one of physically or electromagnetically.


