Handler Image Capture and Position Adjustment for Test Efficiency
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional test systems require devices under test to remain in the test section for extended periods, limiting throughput and efficiency due to the need for image capture and position alignment, which restricts the number of devices that can be tested simultaneously.
Innovation Solution
A handler system that includes a heat applying section to control the temperature of devices under test, a device image capturing section that moves in two non-parallel directions to capture images of devices on a tray, and a position adjusting section to align devices with sockets, allowing for efficient image capture and position adjustment before conveying the tray into the test section.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If image capture and position alignment are performed in the test section after devices are conveyed, then position alignment accuracy is improved, but the time devices stay in the test section increases
Solution Approach 1:
The patent performs image capture and position alignment operations in the heat applying section before the devices are conveyed to the test section. The device image capturing section captures images of devices on the tray, and the position adjusting section adjusts positions based on these images, all while devices are still in the heat applying section. This preliminary action eliminates the need for extended occupancy in the test section.
2Measurement precision
If devices are attractively supported on a contact arm for image capture, then measurement capability is improved, but the number of devices that can be processed simultaneously is limited
Solution Approach 1:
The patent divides the image capture function into multiple independent device image capturing sections, with each section equipped with its own image capture device. This segmentation allows multiple devices to be imaged simultaneously, increasing throughput while maintaining measurement precision for each individual device.
Solution Approach 2:
The patent transitions from a single-contact-arm configuration to a multi-section arrangement where device image capturing sections are distributed across different spatial locations. This dimensional expansion allows parallel processing of multiple devices by utilizing multiple imaging stations working simultaneously on different devices.
3Device complexity
If a single image capture device is used, then device complexity is reduced, but the test time increases due to sequential processing
Solution Approach 1:
Multiple device image capturing sections perform image capture operations in parallel before devices are conveyed to the test section. This preliminary parallel action captures images of multiple devices simultaneously, reducing the overall time required compared to sequential capture by a single device.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the time devices under test need to stay in the test section, increases the number of devices that can be tested concurrently, and enhances overall test efficiency by streamlining the image capture and alignment process.
Implementation Method 1
a heat applying section into which a tray on a surface of which the plurality of devices under test are placed is conveyed and that controls the temperature of the plurality of devices under test to a predetermined test temperature
Implementation Method 2
a heat applying section into which a tray on a surface of which the plurality of devices under test are placed is conveyed and that controls the temperature of the plurality of devices under test
Data Source
AI summary
A handler for conveying a plurality of devices under test to a socket for a test that can reduce a test time includes: a test section provided with the socket; a heat applying section into which a tray having a plurality of devices under test placed on its surface is conveyed and that controls the temperature of the devices under test to a predetermined test temperature and conveys the tray into the test section; a device image capturing section that in the heat applying section, captures images of the respective devices under test by moving with respect to the surface of the tray in two non-parallel directions of a first direction and a second direction; and a position adjusting section that adjusts the positions of the devices under test with respect to the socket based on the images of the devices under test captured by the device image capturing section.