Handler Insert With Detachable Support Member For Semiconductor Testing
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Solution Overview
Problem
Conventional inserts for handlers used in semiconductor testing are prone to damage due to their small stepped portions, leading to increased manufacturing costs and risk of semiconductor device damage, as they require frequent replacement and additional processing of test sockets.
Innovation Solution
A detachable support member made of synthetic resin, such as Kapton film, with communication holes to facilitate electrical contact between semiconductor device terminals and an external contactor, reducing the risk of damage and allowing for easy replacement when damaged.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a small stepped portion is used to support the semiconductor device, then the terminals can easily contact the tester, but the stepped portion is vulnerable to impact and may be easily damaged
Solution Approach 1:
The support structure is divided into two separate components: a reusable insert body and a replaceable support portion. This segmentation allows the vulnerable support portion to be easily replaced when damaged, while the expensive insert body can be reused, resolving the contradiction between ease of contact and durability.
Solution Approach 2:
The support portion is designed as a low-cost, easily replaceable component that can be discarded when damaged. This allows the system to maintain ease of operation while accepting that the support portion will be replaced frequently, rather than requiring the entire insert to be replaced.
2Ease of operation
If the stepped portion protrudes inwardly, then the semiconductor device can be supported, but the tester needs to have a groove formed, increasing manufacturing costs
Solution Approach 1:
The support function is extracted from the tester and transferred to a separate, removable support portion. This eliminates the need to modify the tester structure with grooves, as the support portion can be inserted into a simple through-hole in the insert body, reducing tester manufacturing costs while maintaining support capability.
Solution Approach 2:
The support portion acts as an intermediary component between the insert body and the semiconductor device. It provides the necessary support function without requiring direct integration with the tester, thereby avoiding the need for costly tester modifications.
3Reliability
If the stepped portion is damaged, then the entire insert needs to be replaced, increasing replacement costs
Solution Approach 1:
The insert is segmented into a reusable body and a replaceable support portion. When the support portion is damaged, only that portion needs to be replaced, not the entire insert. This significantly reduces replacement costs while maintaining the support function.
Solution Approach 2:
The support portion is designed to be discarded when damaged and recovered (replaced) as a separate component. The valuable insert body is recovered and reused, minimizing waste and replacement costs.
Data Source
AI summary
An insert for a handler which may be easily replaced when damaged because a semiconductor device is often received in the insert. The insert in which the semiconductor device including a plurality of terminals is received and which allows the semiconductor device to contact an external contactor includes: an insert body that has a through-hole which is formed in a central portion of the insert body and into which the semiconductor device is to be inserted; and a support member that crosses the through-hole to be detachably coupled to the insert body and supports the semiconductor device inserted into the through-hole, wherein a plurality of communication holes are formed to correspond in position to the terminals of the semiconductor device and to pass through the support member from a top surface to a bottom surface of the support member such that the terminals and the external contactor are brought into contact with each other.