Internal State Tracking via Hash Observation Bus in IC Testing

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Solution Overview

Problem

Existing testing tools and techniques for integrated circuits, such as processors, struggle to capture a satisfactory percentage of errors and provide adequate coverage of various circuits and functionalities, particularly in units like fetch/branch prediction circuitry, due to internal states being invisible to software.

Innovation Solution

Implementing a hash value calculation circuit coupled to hardware functional units via an observation bus, allowing these units to autonomously and unilaterally communicate data elements for calculating hash values, which are then compared to expected values to detect errors, with standardized interfaces that remain static throughout development.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If random instruction sequence (RIS) tools and techniques are used to test processors, then testing can be performed, but error detection coverage and circuit functionality coverage remain insufficient

Engineering Contradiction:
Improveerror detection coverageVSAvoidtesting system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent introduces an intermediary hashing mechanism that aggregates internal state data from multiple hardware functional units into compressed hash values. This mediator layer enables comprehensive error detection coverage without requiring direct access to all internal states, thus maintaining testing effectiveness while reducing system complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent transforms the testing approach by changing parameters from direct internal state observation to hash value comparison. By computing hash values of internal states and comparing them against expected hash values, the system achieves higher error detection coverage with simpler testing infrastructure.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If internal states of hardware functional units are made observable for testing, then error detection improves, but interface complexity and testbench requirements increase

Engineering Contradiction:
Improveinternal state observabilityVSAvoidinterface and testbench complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential information needed for testing by computing hash values of internal states rather than exposing all internal state data. This extraction approach provides sufficient measurement precision for error detection while minimizing interface and testbench complexity.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates simplified copies of internal state information in the form of hash values. These hash value copies serve as proxies for the actual internal states, enabling observability without requiring complex interfaces or testbenches to access the original detailed states.

Inventive Principle:
Principle #26Copying

3Productivity

If standardized static interfaces are implemented for hash value calculation, then flexibility and efficiency improve, but adaptability to different hardware functional units may be limited

Engineering Contradiction:
Improvetesting efficiencyVSAvoidhardware functional unit compatibility
Core Design Contradiction:
ProductivityVSAdaptability or versatility

Solution Approach 1:

The patent implements universal hashing interfaces that can work with multiple types of hardware functional units. The hash value calculation mechanism is designed to be hardware-agnostic, accepting data elements from various functional units (ALU, FPU, branch prediction, etc.) through standardized interfaces, thus achieving both efficiency and adaptability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20250377994A1Common control and/or observation for internal state tracking
Publication Date: 2025.12.11 ARM LTD
  • US20250377994A1 patent drawing
  • US20250377994A1 patent drawing
  • US20250377994A1 patent drawing

AI summary

The present disclosure relates generally to integrated circuits and relates more particularly to circuits, systems, and/or processes for common control and/or observation for internal state tracking.