Hexagonal Boron Nitride Thin Film CVD Growth

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current methods for producing hexagonal boron nitride thin films face challenges in achieving large area, uniform thickness, and high crystallinity, which are essential for practical applications in electronics, due to issues with surface roughness, impurity contamination, and non-uniformity in existing synthesis techniques.

Innovation Solution

A method involving the use of a metal thin film with elements like Fe, Ni, Co, or Cr as catalysts, where a chemical vapor deposition (CVD) process is employed to form a hexagonal boron nitride thin film with a thickness of 1 nm or more, utilizing a metal catalyst with specific surface orientations and composition ratios to enhance crystallinity and uniformity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If hexagonal boron nitride thin film is produced by exfoliation from bulk crystals, then high crystallinity and atomic-level flatness are achieved, but the film size is extremely small (around 1 μm) and thickness control is difficult

Engineering Contradiction:
Improvecrystallinity and flatnessVSAvoidfilm size
Core Design Contradiction:
Manufacturing precisionVSArea of stationary object

Solution Approach 1:

A metal film is introduced as an intermediary substrate to enable CVD growth of h-BN films. The metal film serves as a catalyst and template, allowing large-area high-quality h-BN films to be grown that can be subsequently transferred to target substrates, thus resolving the size limitation of exfoliated films

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The mechanical exfoliation process is replaced with chemical vapor deposition (CVD) growth. Instead of physically peeling layers from bulk crystals, h-BN films are grown in-situ through chemical reactions on metal film substrates, enabling precise thickness control and large-area production while maintaining high crystallinity

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Area of stationary object

If conventional CVD method is used to synthesize h-BN film on substrate surface, then large area coverage is achieved, but the film thickness is non-uniform and crystallinity is reduced

Engineering Contradiction:
Improvefilm areaVSAvoidthickness uniformity and crystallinity
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

A metal film is used as an intermediary substrate during CVD growth. This metal film catalyst enables uniform nucleation and growth across large areas while maintaining high crystallinity, solving the problem of non-uniform thickness and reduced crystallinity in conventional direct substrate growth

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The metal film substrate is prepared in advance with specific surface orientations and compositions before CVD growth. This preliminary preparation ensures uniform catalytic activity across the substrate surface, leading to uniform film thickness and high crystallinity during subsequent growth

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If metal film is used as catalyst in CVD process, then large area and uniform thickness are achieved, but surface roughness and impurity contamination occur

Engineering Contradiction:
Improvethickness uniformityVSAvoidsurface roughness and impurity
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The surface orientation and composition parameters of the metal film catalyst are optimized to minimize surface roughness and impurity formation. By selecting specific crystal orientations and metal compositions, the catalytic activity is enhanced while harmful side effects are reduced

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The metal film catalyst is removed or transferred away from the final h-BN product. The h-BN film is grown on the metal film, then the metal catalyst is selectively removed or the h-BN is transferred to a target substrate, eliminating the source of surface roughness and impurity contamination

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in a hexagonal boron nitride thin film with uniform thickness, high crystallinity, and reduced grain boundaries, suitable for industrial applications, particularly in electronic devices, by effectively shielding substrate influences and improving material properties.

Implementation Method 1

a method involving the use of a metal thin film with elements like Fe, Ni, Co, or Cr as catalysts, where a chemical vapor deposition (CVD) process is employed to form a hexagonal boron nitride thin film

Methodology Applied
Scientific EffectCatalysis: Catalysis

Implementation Method 2

a chemical vapor deposition (CVD) process is employed to form a hexagonal boron nitride thin film with a thickness of 1 nm or more

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Data Source

PatentUS11352692B2Hexagonal boron nitride thin film and method for producing the same
Publication Date: 2022.06.07 THE JAPAN SCI & TECH AGENCY
  • US11352692B2 patent drawing
  • US11352692B2 patent drawing
  • US11352692B2 patent drawing

AI summary

The present invention is to provide: a method for producing a novel hexagonal boron nitride thin film suitable for industrial use such as application to electronics, in which a hexagonal boron nitride thin film having a large area, a uniform thickness of 1 nm or more, with few grain boundaries can be produced inexpensively; and a hexagonal boron nitride thin film. The hexagonal boron nitride thin film according to the present invention is characterized by having a thickness of 1 nm or more, and an average value of the full width at half maximum of the E2g peak obtained from Raman spectrum of 9 to 20 cm−1.