HBT Base-Collector Grade Layer for Reduced Electron Blocking

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Solution Overview

Problem

Heterojunction bipolar transistors (HBTs) made of InP/In0.53Ga0.47As face challenges such as large electric fields in the junction region leading to breakdown, discontinuity in the conduction band causing electron blocking effects, and difficulty in reducing the thickness of the base-collector graded layers.

Innovation Solution

A heterojunction bipolar transistor design that includes a base-collector grade layer with at least two stacked periodic structures, each comprising an In0.53Ga0.47As layer and an AlxGayIn1-x-yAs layer, where x ranges from 0.04 to 0.44 and y ranges from 0.44 to 0.04, with the AlxGayIn1-x-yAs layer thickness ranging from 0.6 nm to 1.8 nm.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional base-collector graded layer is used, then the conduction band discontinuity is eliminated, but the layer thickness remains large

Engineering Contradiction:
Improveconduction band continuityVSAvoidbase-collector grade layer thickness
Core Design Contradiction:
ReliabilityVSLength of moving object

Solution Approach 1:

The base-collector graded layer is segmented into multiple thin sub-layers with different Al compositions, where each sub-layer has a thickness of 0.6-1.8 nm. This segmentation allows the total graded layer thickness to be reduced to 1-5 nm while maintaining continuous conduction band transition through gradual composition changes across the stacked sub-layers.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each sub-layer within the graded layer has a locally optimized Al composition specifically designed to achieve lattice matching with InP while providing the required bandgap transition. The Al composition varies locally from 0.04 to 0.44 in different sub-layers, enabling precise control of conduction band alignment at each interface while maintaining overall thinness.

Inventive Principle:
Principle #3Local quality

2Reliability

If the In composition is adjusted to lower electron blocking effect, then lattice mismatch between InGaAs and InP layers occurs

Engineering Contradiction:
Improveelectron blocking effect reductionVSAvoidlattice matching
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The Al composition parameter in AlxGayIn1-x-yAs is changed across different sub-layers to achieve lattice matching with InP. By varying x from 0.04 to 0.44 and y from 0.44 to 0.04 correspondingly, the lattice constant is adjusted to match InP while the bandgap is optimized to reduce electron blocking effect, resolving the contradiction between composition stability and electron blocking reduction.

Inventive Principle:
Principle #35Parameter changes

3Speed

If the base-collector graded layer thickness is reduced, then the cutoff frequency increases, but the conduction band discontinuity may not be fully eliminated

Engineering Contradiction:
Improvecutoff frequencyVSAvoidconduction band continuity
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The graded layer is divided into 1-5 stacked sub-layers, each only 0.6-1.8 nm thick, allowing the total thickness to be reduced to 1-5 nm for higher cutoff frequency. Simultaneously, the segmentation enables precise control of conduction band alignment at each interface through local composition optimization, ensuring continuous conduction band transition despite the reduced total thickness.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20250031395A1Heterojunction bipolar transistor and base-collector grade layer
Publication Date: 2025.01.23 NAT TAIWAN UNIV
  • US20250031395A1 patent drawing
  • US20250031395A1 patent drawing
  • US20250031395A1 patent drawing

AI summary

A heterojunction bipolar transistor and a base-collector grade layer. The heterojunction bipolar transistor includes a substrate, a sub-collector layer, a collector layer, a base layer, a base-collector grade layer and an emitter layer. The sub-collector layer is disposed on the substrate. The collector layer is disposed over the sub-collector layer. The base layer is disposed over the collector layer. The base-collector grade layer is disposed between the base layer and the collector layer, and includes at least two stacked periodic structures. Each periodic structure includes an In0.53Ga0.47As layer and an AlxGayIn1-x-yAs layer stacked on the In0.53Ga0.47As layer. The range of x is 0.04˜0.44, the range of y is 0.44˜0.04, and the thickness of the AlxGayIn1-x-yAs layer is 0.6 nm˜1.8 nm. The emitter layer is disposed on the base layer.