Heat Source Position Identification Using Optical Reflection Analysis
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing systems face challenges in accurately identifying the three-dimensional position of a heat source within a measurement object, particularly due to limited time resolution and insufficient analysis of the depth direction, especially in objects with small thickness where thermal responses are fast.
Innovation Solution
An analysis system that applies a stimulation signal to the measurement object, irradiates it with light, and detects the reflected light to derive the distance to the heat source based on changes in reflectance, using phase delay analysis to improve time resolution and accurately identify the heat source position.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an infrared camera is used to measure heat generated by a heat source, then the heat source position can be identified, but the time resolution is limited and the depth direction position cannot be analyzed with high accuracy
Solution Approach 1:
The patent replaces the infrared camera-based thermal imaging system with an optical reflection measurement system. Instead of using thermal radiation detection (infrared camera), the system uses light reflection from the measurement object surface, which responds to thermal changes caused by the heat source. This substitution enables sub-nanosecond time resolution because optical reflection measurements can be performed much faster than infrared camera frame rates, while still achieving high depth direction position accuracy through the relationship between thermal response time and heat source depth.
2Speed
If the measurement object has small thickness, then the thermal response is fast, but the infrared camera time resolution is insufficient to analyze the depth direction position with high accuracy
Solution Approach 1:
The patent substitutes the infrared camera measurement system with an optical reflection-based thermal response measurement system. The optical system measures changes in light reflection intensity caused by thermal expansion or refractive index changes in the measurement object due to the heat source. This substitution allows the system to capture extremely fast thermal responses (sub-nanosecond scale) that occur in thin measurement objects, enabling accurate depth direction position analysis even when thermal responses are very fast.
Solution Approach 2:
The patent changes the measurement parameter from direct thermal radiation detection (infrared intensity) to optical reflection intensity changes caused by thermal effects. By measuring how the reflection properties of light change in response to thermal conditions, the system can achieve both high time resolution and high depth position accuracy. The reflection intensity varies with temperature, allowing the system to infer heat source position from temporal characteristics of the reflection signal.
3Device complexity
If only two-dimensional position on surface is identified, then the analysis is simple, but the three-dimensional position including depth direction cannot be identified
Solution Approach 1:
The patent adds the depth direction dimension to the position identification by utilizing the temporal characteristics of the optical reflection signal. While the spatial measurement remains two-dimensional (surface position), the system infers the third dimension (depth) from the time characteristics of the thermal response. The depth direction position is determined by analyzing how the thermal response time varies with heat source depth, effectively adding dimensional information through temporal measurement without increasing spatial measurement complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-accuracy identification of the heat source position with sub-nanosecond time resolution and reduced analysis errors, even in objects with small thickness and fast thermal responses, by maximizing reflectance changes on surfaces with different refractive indices.
Implementation Method 1
a light irradiation unit that irradiates the measurement point with light; a light detection unit that detects light reflected from the measurement point according to the irradiation of light
Implementation Method 2
a stimulation current is applied to the measurement object that is irradiated with the light. If there is a short-circuited portion inside the measurement object, the short-circuited portion generates heat and becomes a heat source according to the application of the stimulation current
Data Source
AI summary
A heat source position inside a measurement object is identified with high accuracy by improving time resolution.An analysis system according to the present invention is an analysis system that identifies a heat source position inside a measurement object, and includes a condition setting unit that sets a measurement point for one surface of the measurement object, a tester that applies a stimulation signal to the measurement object, a light source that irradiates the measurement point of the measurement object with light, a photo detector that detects light reflected from a predetermined measurement point on the surface of the measurement object according to the irradiation of light and outputs a detection signal, and an analysis unit that derives a distance from the measurement point to the heat source position based on the detection signal and the stimulation signal and identifies the heat source position.