Heated Functional Plate Wafer Cleaning for Low-Particle IPA Drying

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Solution Overview

Problem

The use of liquid isopropyl alcohol (IPA) in semiconductor wafer cleaning introduces significant particle contamination, necessitating a method to reduce this contamination during the cleaning process.

Innovation Solution

A wafer cleaning method and system that utilizes a heated functional plate to vaporize distilled IPA liquid into IPA vapor, followed by drying the semiconductor wafer with a clean gas, thereby minimizing particle contamination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If liquid IPA is used for wafer cleaning, then the wafer surface can be effectively cleaned and pattern collapse is prevented, but significant particle contamination is introduced onto the wafers

Engineering Contradiction:
Improvewafer cleanlinessVSAvoidparticle contamination
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent changes the physical state of IPA from liquid to vapor by controlling temperature parameters. The substrate is heated to a temperature range that promotes IPA vaporization, transforming the cleaning medium from liquid form (which causes particle contamination) to vapor form (which reduces particle contamination while maintaining cleaning effectiveness).

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent utilizes the phase transition of IPA from liquid to vapor state. By heating the substrate, the IPA liquid applied to the wafer surface vaporizes, creating a vapor-phase cleaning environment that eliminates the particle contamination issues associated with liquid IPA while preserving the cleaning benefits.

Inventive Principle:
Principle #36Phase transitions

2Reliability

If IPA liquid is used to displace deionized water, then pattern collapse risk is reduced, but particle contamination increases

Engineering Contradiction:
Improvepattern stabilityVSAvoidparticle contamination
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent changes the temperature parameter to induce phase transition. By maintaining the substrate at elevated temperatures during IPA application, the IPA remains in vapor phase or transitions quickly from liquid to vapor, providing the pattern stability benefits of IPA while avoiding the particle contamination associated with liquid IPA handling and application.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs phase transition of IPA from liquid to vapor to resolve the contradiction. The vaporized IPA provides effective displacement of deionized water and pattern stabilization without introducing the particle contamination that occurs during liquid IPA dispensing and handling.

Inventive Principle:
Principle #36Phase transitions

3Object-generated harmful factors

If heated functional plate is used to vaporize IPA, then particle contamination is reduced, but energy consumption increases

Engineering Contradiction:
Improveparticle contaminationVSAvoidheating energy
Core Design Contradiction:
Object-generated harmful factorsVSUse of energy by moving object

Solution Approach 1:

The patent utilizes phase transition of IPA from liquid to vapor, which occurs at relatively low temperatures compared to other phase changes. This allows effective vaporization with moderate heating energy input, reducing particle contamination while keeping energy consumption at acceptable levels for semiconductor manufacturing processes.

Inventive Principle:
Principle #36Phase transitions

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Reduces particle contamination by using vaporized IPA, enhancing the cleanliness and integrity of semiconductor wafers during processing.

Implementation Method 1

enabling one or more heating elements of one of the two plates to heat the one of the two plates to vaporize the distilled IPA liquid into IPA vapor

Methodology Applied
Scientific EffectVaporization: Evaporation

Implementation Method 2

dispensing a gas through the dispense nozzle of the wafer processing system into the processing space to dry the semiconductor wafer

Methodology Applied
Scientific EffectEvaporation: Evaporation

Data Source

PatentUS20250323035A1Wafer cleaning method and system using heated functional plate
Publication Date: 2025.10.16 TOKYO ELECTRON LTD
  • US20250323035A1 patent drawing
  • US20250323035A1 patent drawing
  • US20250323035A1 patent drawing

AI summary

A wafer processing method and system are provided. The wafer processing system includes a controller configured to control a dispense nozzle of the wafer processing system to dispense distilled IPA liquid onto a semiconductor wafer in a processing space between two plates of the wafer processing system. The controller is further configured to control one or more heating elements of one of the two plates to heat the one of the two plates to vaporize the distilled IPA liquid into IPA vapor, and control the dispense nozzle to dispense a gas into the processing space to dry the semiconductor wafer.