Helium Mass Spectrometric Fine-Leak Test Waiting Time
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Solution Overview
Problem
Current helium mass spectrometric fine-leak test methods for sealed electronic components face challenges in accurately determining the maximum test-waiting time, leading to unbalanced reliable storage life and leak rate criteria, particularly for small components with high leak rates, which limits the number of components that can be detected in a batch and makes stricter criteria operable.
Innovation Solution
A method for quantitative determination of the maximum test-waiting time based on the minimum helium gas exchange time constant (τHemin) is introduced, allowing for the extension of storage and test waiting times, and the criterion for measured leak rate is made stricter by employing formulas to calculate the maximum test-waiting time for both helium pressurizing and prefilling methods.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the maximum test-waiting time is qualitatively determined as 0.5 hour or 1 hour in fixed scheme standards, then the test procedure is simple to operate, but small components with high leak rates cannot be detected and the reliable storage life becomes unbalanced
Solution Approach 1:
The patent changes the parameter determination method from qualitative fixed values (0.5h or 1h) to quantitative calculation based on component characteristics. The maximum test-waiting time is calculated using formulas that incorporate cavity volume, helium gas exchange time constant, and leak rate criteria, allowing optimization for each specific component type while maintaining operational clarity through standardized calculation procedures.
2Productivity
If the maximum test-waiting time is extended to improve detection capability, then more components can be detected in batch, but the background leak rate control becomes difficult and operability becomes problematic
Solution Approach 1:
The patent introduces dynamic adjustment of test-waiting time based on component characteristics rather than using fixed extended periods. The calculation formulas allow the maximum test-waiting time to be optimized for each component's cavity volume and leak rate requirements, enabling batch processing of multiple component types while maintaining control over background leak rates through scientifically determined time limits.
3Measurement precision
If stricter leak rate criteria are applied to improve sealability assessment, then the sealability classification becomes more accurate, but the number of components that can be detected in the same batch is limited
Solution Approach 1:
The patent applies different leak rate criteria and test-waiting time parameters to different component categories based on their cavity volumes and application requirements. By locally optimizing the test parameters for each component type rather than using uniform strict criteria for all components, the system achieves accurate sealability assessment for critical components while maintaining batch processing efficiency for less critical applications.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively lengthens the total test and storage time, allows for stricter leak rate criteria, and expands the applicable cavity volume range, enabling more reliable storage life and operable batch testing for sealed electronic components.
Implementation Method 1
a helium mass spectrometric leak detector detects actually measured leak rate Rt of the component under test
Data Source
AI summary
A method for helium mass spectrometric fine-leak test is based on quantitative determination of maximum test-waiting time, which gives a method for quantitative determination of the maximum test-waiting time for fine-leak test during a helium mass spectrometric test process of the sealability, and gives a method for determining the criterion for measured leak rate by taking the minimum helium gas exchange time constant, i.e., a rigour grade τHemin, of an acceptable sealed electronic component as a basic criterion for helium mass spectrometric fine-leak test. Based on the inventive method for quantitative determination of the maximum test-waiting time, for most of the cavity volume ranges, the maximum test-waiting time that is determined accurately may be much longer than 1 hour or 0.5 hour as determined qualitatively by the existing related standards.