Multi-Channel Heterojunction Anode Layout for Higher Breakdown Voltage

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Solution Overview

Problem

Junction Barrier Schottky Diodes with multiple 2DEG channel structures experience premature breakdown due to electric field concentration at the Schottky interface when subjected to large reverse bias voltages.

Innovation Solution

A semiconductor structure with a multi-channel heterojunction layer and anode fingers of varying lengths, where each anode finger partially penetrates the heterojunction layer to control individual channels, thereby avoiding electric field concentration and enhancing breakdown voltage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a Junction Barrier Schottky Diode with a plurality of 2DEG channel structures is used, then electron mobility rate and conductivity are improved, but electric field concentration occurs at the Schottky interface leading to premature breakdown

Engineering Contradiction:
Improvebreakdown voltageVSAvoidelectric field concentration
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The anode contact is segmented into multiple anode fingers of different lengths, where each anode finger corresponds to and contacts a specific heterojunction layer. This segmentation distributes the electric field across multiple contact points rather than concentrating it at a single interface, thereby preventing electric field peaks while maintaining the multi-channel structure's high electron mobility and conductivity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each anode finger is designed with locally optimized properties - different lengths corresponding to different heterojunction depths - allowing each contact region to have tailored electrical characteristics. This local quality optimization ensures that each anode finger-heterojunction interface operates under optimal conditions without creating overall electric field concentration

Inventive Principle:
Principle #3Local quality

2Reliability

If multiple 2DEG channel structures are implemented, then series resistance is reduced, but device breakdown occurs prematurely due to electric field peaks

Engineering Contradiction:
Improvebreakdown voltageVSAvoidelectric field peak
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The anode contact structure is divided into multiple segmented anode fingers, each contacting a specific heterojunction layer. This segmentation distributes the electric field across multiple interfaces, preventing the formation of electric field peaks that would lead to premature breakdown, while preserving the low series resistance benefit of multiple channels

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from a conventional single-plane anode contact to a multi-depth anode finger structure that extends into the vertical dimension. By placing anode fingers at different depths corresponding to different heterojunction layers, the electric field distribution is extended across multiple spatial dimensions, eliminating concentration peaks while maintaining low resistance

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20250194122A1Semiconductor structure and method for manufacturing thereof
Publication Date: 2025.06.12 ENKRIS SEMICON
  • US20250194122A1 patent drawing
  • US20250194122A1 patent drawing
  • US20250194122A1 patent drawing

AI summary

A semiconductor structure includes a substrate and a multi-channel heterojunction layer, and an anode and a cathode. The multi-channel heterojunction layer includes a first layer of heterojunction, . . . , a mth layer of heterojunction, . . . , and a nth layer of heterojunction; and the anode includes at least one set of anode fingers, any one set of anode fingers includes n anode fingers with different lengths, the n anode fingers include a first anode finger, . . . , a mth anode finger, . . . , and a nth anode finger, and the mth anode finger partially penetrates the multi-channel heterojunction layer to the mth layer of heterojunction. A plurality of channels of the semiconductor structure are controlled by a plurality of anode fingers, respectively, avoiding generation of an electric field peak, and further improving a breakdown voltage of the semiconductor structure.