High-Frequency Module Switch Inspection With One Shared Terminal
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Solution Overview
Problem
The increasing number of inspection terminals in high frequency modules, which hinders miniaturization and cost reduction, due to the need for separate terminals for each switch and capacitor, complicates pre-shipment inspection.
Innovation Solution
A configuration where a resistor is connected between the connection points of capacitors and switches, allowing a single inspection terminal to inspect multiple switches by varying the resistance values based on control states, reducing the number of required inspection terminals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate inspection terminals are provided for each switch and capacitor, then inspection accuracy is improved, but the number of inspection terminals increases
Solution Approach 1:
The patent applies universality by designing a single inspection terminal that can inspect multiple switches (first switch and second switch) through a shared inspection line. The inspection terminal is configured to selectively connect to different switches via control signals, allowing one terminal to perform the inspection function that would otherwise require multiple separate terminals, thereby reducing the total number of inspection terminals while maintaining inspection capability
Solution Approach 2:
The patent merges the inspection functions for multiple switches into a single inspection terminal. The inspection line is shared among multiple switches, and the inspection terminal is designed to sequentially or selectively inspect different switches through this common line. This merging approach consolidates what would be separate inspection paths into one unified inspection mechanism, reducing the number of terminals needed
2Device complexity
If the number of inspection terminals is reduced, then device complexity is reduced, but inspection precision may deteriorate
Solution Approach 1:
The patent applies dynamics by making the inspection terminal selectively connectable to different switches through control signals. The connection state of the inspection terminal to each switch can be dynamically changed based on which switch is being inspected. This dynamic switching capability allows a single terminal to effectively inspect multiple switches with the same precision as dedicated terminals would provide, maintaining inspection quality while reducing terminal count
Solution Approach 2:
The patent introduces an intermediary mechanism in the form of a shared inspection line and control circuitry that mediates between the single inspection terminal and multiple switches. This intermediary structure allows the inspection terminal to communicate with and inspect multiple different switches sequentially or selectively, bridging the gap between having fewer terminals and maintaining comprehensive inspection capability across all switches
Data Source
AI summary
A high frequency module includes: a first capacitor C1 having a first end connected to a first signal line; a second capacitor having a first end is connected to a second signal line; a first switch provided between a second end of the first capacitor and a reference potential; a second switch provided between a second end of the second capacitor and the reference potential; an inspection terminal allowing inspection of both the first switch and the second switch; and a resistor connected between a connection point between the first capacitor and the first switch.