High-Side Drive Circuit Overlap Prevention for Power Semiconductors
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Solution Overview
Problem
Power semiconductor device pairs, particularly high-side and low-side devices, are prone to 'latch-on' failure due to cross-conduction caused by timing overlap between reset input pulses and voltage-recovery periods, leading to catastrophic damage in high-voltage integrated circuits.
Innovation Solution
A high-side drive circuit with an overlap-prevention circuit is implemented, which includes an input circuit generating control signals and a high-voltage circuit that prevents timing overlap between reset control signals and voltage-recovery periods, using edge-trigger circuits and level shifters to ensure proper timing alignment and prevent unwanted set signals during high-voltage recovery.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a high-side drive circuit is used to control the high-side device, then the power semiconductor device pair can be controlled for high-voltage applications, but timing overlap between reset control signals and voltage-recovery periods can cause latch-on failure and cross-conduction
Solution Approach 1:
The overlap-prevention circuit proactively detects the voltage-recovery period and preemptively prevents the reset control signal from being output during this critical time window, eliminating the possibility of latch-on failure before it can occur
Solution Approach 2:
The overlap-prevention circuit acts as an intermediary between the input circuit and the high-voltage circuit, filtering and conditioning the control signals to ensure they are properly timed and free from harmful overlaps before reaching the power semiconductor devices
2Productivity
If reset control signals are output during voltage-recovery periods, then the high-side device can be turned off, but simultaneous conduction of high-side and low-side devices occurs causing cross-conduction
Solution Approach 1:
The overlap-prevention circuit applies preliminary anti-action by blocking the reset control signal during the voltage-recovery period, preventing the harmful effect of cross-conduction before it can manifest
Solution Approach 2:
The circuit monitors the voltage-recovery period and uses this feedback information to dynamically control the output of reset signals, ensuring they are only generated when safe to do so
Data Source
AI summary
In a general aspect, an apparatus can include a low-side drive circuit configured to control a low-side device of a power semiconductor device pair and a high-side drive circuit configured to control a high-side device of the power semiconductor device pair. The high-side drive circuit can include an input circuit configured to receive an input signal and produce, based on the input signal, a first control signal, from which a latch set signal is produced to turn on the high-side device, and a second control signal, from which a latch reset signal is produced to turn off the high-side device. The high-side drive circuit can further include an overlap-prevention circuit configured to prevent timing overlap between the second control signal and a voltage-recovery period of the high-voltage circuit, where the voltage-recovery period occurs after turning off the high-side device of the power semiconductor device pair.


