High-Voltage Pulse Test System Common Base Frame
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Solution Overview
Problem
High-voltage pulse test systems require substantial physical space and time-consuming setup due to the large size and separate arrangement of auxiliary components like cut-off spark gaps, overshoot compensators, and voltage dividers, necessitating significant conductive connections and spacings.
Innovation Solution
Combining at least two auxiliary components on a common base frame with a single head electrode and a common conductive connecting point, while using additional toroids for screening to manage stray capacitances and electromagnetic fields, thereby reducing physical size and installation time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If auxiliary components (cut-off spark gap, overshoot compensator, voltage divider) are arranged separately with required spacings, then voltage arcs are prevented and measurement accuracy is maintained, but substantial physical space is required and setup time increases
Solution Approach 1:
The patent combines multiple auxiliary components (cut-off spark gap, overshoot compensator, voltage divider) onto a single common base frame with a shared head electrode structure. This merging reduces the overall physical footprint and eliminates the need for separate mounting structures while maintaining functional separation through strategic positioning and screening elements.
Solution Approach 2:
The patent introduces additional toroids as intermediary screening elements positioned between the auxiliary components. These toroids act as electromagnetic shields that prevent voltage arcs and electromagnetic interference between closely spaced components, enabling safe consolidation without compromising reliability.
2Loss of time
If auxiliary components are combined on a common base frame, then installation time is reduced and transport is simplified, but stray capacitances and electromagnetic fields increase
Solution Approach 1:
Additional toroids are positioned as screening elements between the auxiliary components on the common base frame. These toroidal shields act as electromagnetic barriers that reduce stray capacitances and block electromagnetic field interference, allowing components to be closely integrated without harmful electrical interactions.
Solution Approach 2:
The patent applies localized electromagnetic screening using toroids specifically positioned between components that would otherwise interfere with each other. This targeted approach reduces stray capacitances only where needed rather than requiring complete isolation of all components.
3Device complexity
If multiple separate head electrodes are used for auxiliary components, then voltage arcs are prevented, but device complexity and number of conductive connections increase
Solution Approach 1:
The patent merges multiple separate head electrodes into a single common head electrode structure that serves all auxiliary components. This consolidation reduces the number of conductive connections and simplifies the overall device architecture while maintaining arc prevention through proper positioning and screening.
Solution Approach 2:
The common head electrode structure serves multiple functions simultaneously: it provides the electrode for the cut-off spark gap, supports the overshoot compensator, and serves as the reference for the voltage divider. This multi-functional design eliminates the need for separate head electrodes for each component.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration minimizes space requirements, simplifies transport, and reduces installation time while maintaining measurement accuracy and preventing voltage arcs, allowing for efficient operation of high-voltage pulse tests.
Implementation Method 1
using additional toroids for screening to manage stray capacitances and electromagnetic fields
Implementation Method 2
cut-off spark gap
Implementation Method 3
each of the stages comprises a surge capacitance and a switching element
Data Source
AI summary
The present invention relates to a device for system components of a high-voltage impulse test system, preferably for quality assurance of power transformers. According to the invention, a common base frame having only one main electrode common to the system components is proposed for the spatial collection of the system components.