High-Voltage Switch Test Apparatus With Segmented Voltage And Current Sources
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Solution Overview
Problem
Testing high-voltage switch devices for vehicle batteries is inefficient and costly due to the need for high-power voltage sources that generate both high test voltage and current simultaneously, resulting in expensive and large equipment.
Innovation Solution
A test apparatus comprising separate voltage and current sources, with the voltage source providing high test voltage and the current sources generating high test currents, forming closed circuits with the switch device's high-voltage paths, allowing for high-current and high-voltage testing without the need for high power outputs, using isolated sources to minimize electrical power requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single voltage source is used to generate both high test voltage and high test current simultaneously, then the switch device can be tested under full operational conditions, but the voltage source becomes very expensive and large due to high power output requirements
Solution Approach 1:
The patent divides the testing system into separate functional modules: a voltage source for applying high test voltage, current sources for injecting high test currents into positive and negative high-voltage paths, and measurement devices for monitoring switch behavior. This segmentation allows each component to be optimized for its specific function without requiring all components to handle the full power output simultaneously.
Solution Approach 2:
The patent introduces intermediate measurement devices and control units that mediate between the power sources and the switch device under test. These intermediaries enable precise control and monitoring of test parameters, allowing accurate testing of the switch device without requiring the power sources to operate at maximum capacity simultaneously.
2Reliability
If high-power voltage sources and electronic loads are used to provide full test voltage and current, then realistic operational conditions can be simulated, but the test equipment becomes expensive and complex
Solution Approach 1:
The testing apparatus is segmented into independent functional units: voltage application circuitry, current injection circuitry, measurement devices, and control units. Each unit can be independently designed, optimized, and replaced, reducing overall system complexity while maintaining test realism.
Solution Approach 2:
The patent designs the testing apparatus with multi-functional components that can perform multiple testing functions. For example, the same basic circuit architecture can test different switch device configurations by reconfiguring the connection topology, reducing the need for specialized equipment for each test scenario.
3Reliability
If the voltage source delivers high test voltage and high test current simultaneously, then complete switch device functionality can be evaluated, but the equipment size and cost increase significantly
Solution Approach 1:
The patent implements a segmented testing architecture where voltage application and current injection occur through separate circuit paths. The voltage source connects to the switch device through high-voltage terminals, while current sources connect through separate low-voltage terminals, allowing independent optimization of each subsystem's size and power rating.
Solution Approach 2:
The patent transitions from a single-dimensional power delivery approach to a multi-dimensional testing architecture by separating voltage and current application into independent spatial and functional dimensions. This allows the system to achieve comprehensive functional evaluation without requiring a single high-power component, thereby reducing overall equipment volume.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and cost-effective testing of switch devices by reducing the electrical power output requirements of the test apparatus, allowing for realistic simulation of operational conditions without the need for expensive high-power equipment.
Implementation Method 1
a voltage source for generating an electrical test voltage between a positive high-voltage path and a negative high-voltage path
Implementation Method 2
a first current source for feeding a first electrical test current into the positive high-voltage path, wherein the first connecting device, the first current source and the positive high-voltage path together form a first circuit
Implementation Method 3
With closed switching elements, the high-voltage paths are each intrinsically formed with low impedance, so that little heat is produced during operation
Implementation Method 4
The high-voltage paths are isolated from one another with high impedance in the switch device by an insulating resistance
Data Source
AI summary
A test apparatus for testing at least one switch device for a high-voltage battery of a vehicle, includes a voltage source for generating an electrical test voltage between a positive high-voltage path and a negative high-voltage path of the at least one switch device. The test apparatus has a first connecting device and a first current source for feeding a first electrical test current into the positive high-voltage path, wherein the first connecting device, the first current source and the positive high-voltage path together form a first circuit when testing the at least one switch device. The test apparatus has a second connecting device and a second current source for feeding a second electrical test current into the negative high-voltage path, wherein the second connecting device, the second current source and the negative high-voltage path together form a second circuit when testing the at least one switch device.