Hollow Cathode Plasma Electrode for TEM Cleaning

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Solution Overview

Problem

Transmission electron microscopes (TEMs) face challenges in efficiently removing hydrocarbon contaminants due to the confined space near the specimen analytical area, which limits the effectiveness of plasma cleaning devices that rely on external pumps for oxygen radical distribution.

Innovation Solution

A small hollow cathode plasma electrode is mounted on a stage rod, allowing it to be inserted into the TEM for in-situ production of oxygen radicals within the specimen and exchange chambers, reducing the need for auxiliary pumps by generating a plasma close to the cleaning regions and utilizing a smaller source of oxygen radicals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If plasma cleaning devices rely on external pumps for oxygen radical distribution, then cleaning coverage can be achieved, but the cleaning effectiveness is limited in confined spaces near the specimen analytical area

Engineering Contradiction:
Improvecleaning chamber volumeVSAvoidcleaning speed
Core Design Contradiction:
Volume of moving objectVSProductivity

Solution Approach 1:

The patent divides the cleaning function into multiple plasma electrodes positioned at different locations within the chamber. Instead of relying on a single external pump to distribute radicals throughout the entire chamber, multiple localized plasma sources are created, each treating a specific region. This segmentation allows effective cleaning in confined spaces while maintaining overall chamber coverage.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a gas flow system as an intermediary to transport oxygen radicals from the plasma electrode to the confined spaces near the specimen analytical area. The gas flow acts as a carrier, delivering the cleaning radicals to regions that would be difficult to reach with direct plasma exposure alone, thereby enhancing cleaning effectiveness in narrow vacuum paths.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Productivity

If auxiliary pumps are added to improve oxygen radical distribution, then cleaning effectiveness improves, but device complexity increases

Engineering Contradiction:
Improvecleaning effectivenessVSAvoidpump system complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent employs the existing vacuum pump system of the TEM to serve dual purposes: maintaining the vacuum environment and facilitating oxygen radical distribution during plasma cleaning. By utilizing the already-present pump infrastructure and integrating gas flow through existing pathways, the system achieves enhanced cleaning effectiveness without adding auxiliary pump equipment, thereby avoiding increased device complexity.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The existing vacuum pump system is made multi-functional by using it both for maintaining the vacuum environment and for distributing oxygen radicals during plasma cleaning operations. The gas flow system is integrated with the existing vacuum architecture, allowing the same infrastructure to serve multiple purposes and eliminating the need for dedicated auxiliary pumping equipment.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Object-generated harmful factors

If plasma cleaning is performed in the specimen chamber, then contamination is removed, but specimen microstructure may be damaged

Engineering Contradiction:
Improvehydrocarbon contaminationVSAvoidspecimen microstructure damage
Core Design Contradiction:
Object-generated harmful factorsVSObject-affected harmful factors

Solution Approach 1:

The patent employs dynamic control of plasma parameters including gas flow rate, plasma power, and exposure time to optimize the cleaning process. By dynamically adjusting these parameters, the system achieves effective contamination removal while controlling the intensity and duration of plasma exposure to prevent damage to sensitive specimen microstructures. The gas flow rate is specifically modulated to deliver radicals effectively while limiting excessive exposure.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent utilizes controlled changes in physical and chemical parameters of the plasma environment, including gas composition, pressure, temperature, and radical density. By carefully controlling these parameters, the system achieves optimal cleaning effectiveness while preventing conditions that would lead to specimen damage. The gas flow rate and plasma power are specifically tuned to maintain parameters within a safe window for specimen integrity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables effective cleaning of both the specimen and exchange chambers without additional pumps, improving cleaning speed and maintaining the microstructure integrity of the specimen, even in the narrow vacuum paths of TEMs.

Implementation Method 1

plasma-activated, gentle chemical etching of hydrocarbon-containing molecules by oxygen radicals

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

gentle chemical etching of hydrocarbon-containing molecules by oxygen radicals

Methodology Applied
Scientific EffectChemical etching: Ablation

Implementation Method 3

interact with the electron beam of the electron microscope

Methodology Applied
Scientific EffectElectron beam: Electron Beam

Implementation Method 4

The sample stage extends through the instrument airlock and into the microscope analysis chamber

Methodology Applied
Scientific EffectVacuum: Vacuum

Data Source

PatentEP2457247B1Cleaning device for transmission electron microscopes
Publication Date: 2014.04.16 XEI SCI
  • EP2457247B1 patent drawingFigure 1
  • EP2457247B1 patent drawingFigure 2
  • EP2457247B1 patent drawingFigure 3

AI summary

An apparatus for cleaning the specimen and interior specimen chamber of Transmission Electron Microscopes, and similar electron- or charged-particle-beam instruments consisting of a plasma cleaning device mounted on a hollow rod that replaces the stage through the air lock of the instrument by being the same shape and size as the stage support rod. The plasma cleaning device is a small hollow cathode that is excited by RF power. Air or other oxygen containing mixtures is admitted to the plasma through the hollow rod at a pressure below 1 Torr. The plasma creates oxygen radicals from the oxygen containing gas. The oxygen radicals oxidize the hydrocarbons contamination and convert them to easily pumped gases. The apparatus can be attached to the electron microscope whenever cleaning is needed, and then is easily removed to return the instrument to its analytical function.