Hologram Measurement Pattern for 3D Display Quality

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Solution Overview

Problem

Current holographic displays have limited viewing angles due to performance limitations of spatial light modulators, and existing measurement methods struggle with accurate image quality evaluation due to random phase insertion, leading to measurement uniformity issues and errors in normalization.

Innovation Solution

A method and apparatus for generating a hologram measurement pattern by combining test patterns with common grayscale bars, inserting a random phase, and using computer-generated hologram techniques to create a pattern with minimal difference between the reconstructed and original images, ensuring accurate and reliable image quality measurement.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a spatial light modulator with conventional pixel pitch (about 8 μm) is used, then the device complexity is reduced and ease of manufacture is improved, but the viewing angle becomes very narrow (about 2°)

Engineering Contradiction:
Improveviewing angleVSAvoidpixel pitch requirement
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent transitions from conventional 2D display metrics to 3D holographic measurement by incorporating depth information and spatial coordinates (x, y, z) into the measurement pattern. This dimensional expansion enables accurate quality assessment across the entire holographic volume, including viewing angle variations at different depths and positions.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent changes the measurement parameters from simple 2D image quality metrics to comprehensive 3D parameters including depth, spatial position, and intensity distribution throughout the holographic volume. This allows accurate characterization of viewing angle performance and other quality attributes that vary in three-dimensional space.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If random phase is inserted into measurement pattern data, then the measurement process becomes more robust, but measurement uniformity deteriorates and errors in normalization occur

Engineering Contradiction:
Improvemeasurement robustnessVSAvoidmeasurement uniformity
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent implements feedback mechanisms where the measured holographic data is compared against reference patterns, and normalization factors are adjusted based on measured intensity distributions. This feedback loop compensates for the uniformity issues introduced by random phase insertion, maintaining both robustness and precision.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent dynamically adjusts measurement parameters including normalization factors and reference intensity levels based on the actual measured data. This adaptive parameter adjustment compensates for variations introduced by random phase, maintaining measurement uniformity while preserving the robustness benefits.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If comprehensive 3D measurement patterns are used, then measurement accuracy is improved, but the complexity of pattern generation and processing increases

Engineering Contradiction:
Improveimage quality evaluation accuracyVSAvoidpattern generation complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent divides the complex 3D measurement process into segmented components: generating individual holographic patterns at different depths and positions, measuring each segment separately, and then integrating the results. This segmentation reduces the computational complexity of pattern generation and data processing while maintaining comprehensive 3D measurement accuracy.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach improves the accuracy and reliability of holographic display performance measurement by compensating for narrow viewing angles and reducing intensity uniformity issues, enabling objective and precise evaluation of image quality.

Implementation Method 1

a digital holography technique is a technique that can reproduce stereoscopic images as if they existed in space by an optical display method for 3D information (e.g., amplitude and phase) related to 3D objects and real images based on a principle of optical diffraction and interference

Methodology Applied
Scientific EffectOptical diffraction: Diffraction

Implementation Method 2

a digital holography technique is a technique that can reproduce stereoscopic images as if they existed in space by an optical display method for 3D information (e.g., amplitude and phase) related to 3D objects and real images based on a principle of optical diffraction and interference

Methodology Applied
Scientific EffectOptical interference: Interference

Data Source

PatentUS10990063B2Apparatus for measuring quality of holographic display and hologram measurement pattern thereof
Publication Date: 2021.04.27 ELECTRONICS & TELECOMM RES INST
  • US10990063B2 patent drawing
  • US10990063B2 patent drawing
  • US10990063B2 patent drawing

AI summary

The present description may provide a method of generating a hologram measurement pattern for measuring image quality of holographic display, including: generating a test pattern and a common pattern including at least one grayscale bar; generating measurement pattern data by combining the common pattern with a frame of the test pattern; and generating the hologram measurement pattern by inserting a random phase into the measurement pattern data and an apparatus applied thereto, thereby more accurately measuring the quality of the 3D holographic image reproduced by the holographic display.