Holographic Imaging Layout for Weak Scattering Samples

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Solution Overview

Problem

Existing digital holography imaging systems struggle to capture small structures or particles due to low scattering intensity, leading to reduced imaging quality and background noise, which is exacerbated by invasive methods that can damage samples.

Innovation Solution

An imaging device and method that decouples the object and reference beam paths, allowing for balanced light intensities and confinement of the object beam to prevent non-scattered light from reaching the detector, while using a beam splitter to enhance the signal-to-noise ratio by unevenly distributing light intensity between the object and reference beams.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If digital holography imaging is used to image small particles or structures, then non-invasive imaging is achieved, but imaging quality deteriorates due to low scattered light intensity

Engineering Contradiction:
Improvesample damageVSAvoidimaging quality
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The imaging system is segmented into separate object beam path and reference beam path, allowing independent optimization of each path. The object beam is directed through the sample while the reference beam bypasses it, enabling the detection of weak scattered light from small particles without compromising sample integrity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A beam splitter is introduced as an intermediary element to divide the incident light into object and reference beams. This mediator enables the interference pattern formation between the weak scattered object light and the stronger reference light, making small particles visible while maintaining non-invasive imaging conditions.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If invasive imaging methods are used to improve imaging quality of small samples, then imaging quality is improved, but sample integrity deteriorates due to sample damage

Engineering Contradiction:
Improveimaging qualityVSAvoidsample damage
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The beam splitter acts as an intermediary that enables the reference beam to provide a strong reference signal without directly interacting with the sample. This allows high-quality interference pattern formation while the object beam maintains low intensity to prevent sample damage.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system changes the intensity parameters of the object and reference beams independently through the beam splitter. The reference beam can have high intensity for strong signal detection, while the object beam maintains low intensity to avoid sample damage, resolving the contradiction between imaging quality and sample integrity.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If balanced light intensities are used in object and reference beams, then imaging quality is improved, but device complexity increases due to additional optical components

Engineering Contradiction:
Improveimaging qualityVSAvoidoptical path configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The beam splitter serves as a simple intermediary component that naturally divides the light into object and reference beams. By positioning it at the incident light path, the system achieves balanced light intensities without requiring complex additional optical components or active control mechanisms.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The beam splitter performs multiple functions: it divides the incident light into object and reference beams, balances their intensities, and enables interference pattern formation. This multi-functionality reduces the need for additional components, maintaining device simplicity while improving imaging quality.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables high-quality holographic imaging of small objects with improved signal-to-noise ratio and high throughput, allowing for non-invasive imaging of samples without damaging them, suitable for life science and medical research applications.

Implementation Method 1

Digital holography imaging uses scattering of light incident on a sample to acquire spatial information of the sample

Methodology Applied
Scientific EffectLight scattering: Scattering

Implementation Method 2

patterns formed by light based on scattering of light, such as interference patterns between scattered and non-scattered reference light

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentEP4191344B1Imaging device and method for holographic imaging of samples
Publication Date: 2026.01.28 INTERUNIVERSITAIR MICRO ELECTRONICS CENT (IMEC VZW)
  • EP4191344B1 patent drawingFigure 1
  • EP4191344B1 patent drawingFigure 2A
  • EP4191344B1 patent drawingFigure 2B

AI summary

According to an aspect of the present inventive concept there is provided an imaging device for holographic imaging of a sample, the imaging device comprising a light source generating a light beam, a beam splitter splitting the light beam into an object beam along an object beam path and a reference beam along a reference beam path, and a detector. The imaging device defines a sample position. The object beam is propagated through the sample position, and the detector is arranged to prevent non-scattered object light, passing through the sample position without being scattered by the sample, from being incident onto the detector. The reference beam is propagated through the sample position, and the detector is arranged so that non-scattered reference light, passing through the sample position without being scattered by the sample, is incident onto the detector. The detector detects an interference pattern formed by scattered object light, scattered by the sample, and the non-scattered reference light.