Continuous Holographic Lithography Synchronization

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current holographic lithography techniques are limited in creating complex and arbitrary shapes, struggle with patterning large substrates continuously, and lack the combination of fine control and speed for producing three-dimensional nanostructured materials at an industrial scale.

Innovation Solution

A system and method for continuous holographic lithography that synchronizes the motion of a substrate with a moving interference pattern using active, passive, or hybrid phase control methods, allowing for precise control of optical beams to create three-dimensional patterns on a substrate, enabling high-throughput industrial-scale patterning without the need for masks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional holographic lithography uses stationary substrate with interference pattern, then patterning precision is maintained, but productivity is limited and large substrate patterning is impossible

Engineering Contradiction:
Improvepatterning throughputVSAvoidinterference pattern alignment
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent applies dynamics by making both the substrate and interference pattern movable and synchronized. The substrate is moved through the interference pattern at a controlled velocity while the interference pattern is also moved at a matched velocity to maintain relative positioning. This dynamic approach enables continuous patterning of large substrates while maintaining precision through active synchronization of the moving parts.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent implements feedback control through synchronization mechanisms that monitor and adjust the relative positions and velocities of the substrate and interference pattern. By using feedback to maintain the velocity relationship between the moving substrate and the moved interference pattern, the system preserves patterning precision while enabling high-speed continuous processing and large substrate fabrication.

Inventive Principle:
Principle #23Feedback

2Area of stationary object

If substrate is moved through interference pattern, then large substrate patterning is enabled, but interference pattern smearing occurs

Engineering Contradiction:
Improvesubstrate patterning areaVSAvoidinterference pattern definition
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent resolves the smearing problem by making the interference pattern itself movable and synchronizing its velocity with the substrate motion. Instead of a stationary interference pattern that smears when substrate moves, both the substrate and interference pattern move together at matched velocities, maintaining sharp pattern definition while enabling large area coverage through continuous motion.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The synchronization mechanism uses feedback control to maintain the velocity relationship between substrate and interference pattern. By continuously monitoring and adjusting the interference pattern velocity to match substrate velocity, the system prevents pattern smearing while enabling continuous processing of large substrates, thus maintaining precision during motion.

Inventive Principle:
Principle #23Feedback

3Adaptability or versatility

If complex arbitrary shapes are required, then masking is used, but device complexity and process difficulty increase

Engineering Contradiction:
Improvepattern shape complexityVSAvoidmasking system complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent uses dynamic control of the interference pattern generation to create complex arbitrary shapes without physical masks. By dynamically adjusting the parameters and configuration of the interfering beams that generate the interference pattern, complex 3D nanostructures can be formed directly through optical control, eliminating the need for complex masking systems and reducing overall device complexity.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the creation of precise, complex three-dimensional patterns at sub-micron scales with high efficiency, allowing for the production of nanostructured materials on large substrates, overcoming the limitations of traditional holographic lithography by maintaining synchronization between substrate motion and interference patterns, thus enhancing scalability and precision.

Implementation Method 1

an interference pattern is generated between two or more coherent light waves and transferred to a typically photosensitive material

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

The photo is then exposed to light, wherein the regions exposed to light are washed away leaving only the masked areas behind

Methodology Applied
Scientific EffectPhotochemical reaction: Photopolymerisation

Data Source

PatentUS11687004B2System and method for industrial scale continuous holographic lithography
Publication Date: 2023.06.27 PHOTIA INC
  • US11687004B2 patent drawing
  • US11687004B2 patent drawing
  • US11687004B2 patent drawing

AI summary

A system and method for patterning of a substrate at sub-micron length scales using interference lithography that includes a substrate; a chuck that promotes substrate motion; at least two EM beams; a beam phase controller, wherein the phase controller modifies phases of the EM beams with respect to each other creating an interference pattern; a displacement sensor that measures the substrate displacement; and a feedback control mechanism configured to monitor and synchronize the substrate motion with the interference pattern using the beam phase controller and the displacement sensor.