Holographic Microscopy Subpixel Scanning for Wide Field-of-View Resolution

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Solution Overview

Problem

Conventional optical microscopy techniques face limitations in increasing field-of-view (FOV) without compromising imaging resolution, due to inverse proportional relationships between FOV and resolution, as well as physical factors like diffraction limits and optical aberrations.

Innovation Solution

The use of ultra-resolution techniques in holographic microscopy through subpixel scanning and synthetic aperture methods, allowing for the assembly of low-resolution holograms to achieve ultra-high resolution and ultra-wide FOV, beyond the detector's active area, using sensor-scanning techniques and advanced image processing algorithms.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If conventional optical microscopy methods are used to increase the field-of-view, then the FOV is improved, but the imaging resolution deteriorates

Engineering Contradiction:
Improvefield-of-viewVSAvoidimaging resolution
Core Design Contradiction:
Area of stationary objectVSMeasurement precision

Solution Approach 1:

The patent divides the imaging process into multiple low-resolution holograms captured at different subpixel displacements. By segmenting the field-of-view into multiple regions and capturing them separately at subpixel positions, the system can later reconstruct a high-resolution wide FOV image through computational assembly, thus resolving the contradiction between FOV and resolution

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a temporal dimension by capturing multiple holograms at different time points with subpixel displacements. This transforms a 2D spatial sampling problem into a 3D problem (x, y, time), allowing resolution enhancement through temporal sequencing while maintaining wide FOV coverage

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If conventional optical microscopy methods are used to increase the imaging resolution, then the imaging resolution is improved, but the field-of-view deteriorates

Engineering Contradiction:
Improveimaging resolutionVSAvoidfield-of-view
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent merges multiple low-resolution holograms captured at different subpixel displacements into a single high-resolution image. By combining information from multiple measurements taken at offset positions, the system achieves super-resolution while covering a wide field-of-view that exceeds what a single detector position could provide

Inventive Principle:
Principle #5Merging (Combining)

3Area of stationary object

If the detector active sensor area is increased to improve FOV, then the FOV is improved, but the noise floor and pixel performance deteriorate

Engineering Contradiction:
Improvefield-of-viewVSAvoidnoise floor
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The patent creates multiple copies of the same scene at different subpixel displacements and combines them computationally. Instead of using a single large detector with poor pixel performance, the system uses multiple measurements of the same scene at offset positions, effectively copying the measurement process to achieve wide FOV while maintaining excellent pixel-level signal-to-noise ratio

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables significant increases in both imaging resolution and FOV, providing multispectral and hyperspectral imaging capabilities beyond conventional methods, with improved spectral information and phase contrast microscopy, while addressing noise and aberration issues.

Implementation Method 1

fundamental physical factors that limit improvement using conventional methods, such as the diffraction limit

Methodology Applied
Scientific EffectDiffraction: Diffraction

Implementation Method 2

holographic microscopy

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS10088662B2System, method and apparatus for ultra-resolved ultra-wide field-of-view multispectral and hyperspectral holographic microscopy
Publication Date: 2018.10.02 KAZEMZADEH FARNOUD
  • US10088662B2 patent drawing
  • US10088662B2 patent drawing
  • US10088662B2 patent drawing

AI summary

There is disclosed a novel system and method for achieving ultra-resolution, ultra-wide field-of-view multispectral and hyperspectral holographic microscopy and quantitative phase contrast microscopy. In an embodiment, the method comprises: providing a stationary illumination source; acquiring a plurality of low-resolution holograms of an image subject from different locations utilizing a subpixel sensor-scanning synthetic aperture mechanism whereby a detector scanning translationally, radially and/or rotationally; processing the acquired holograms utilizing a processing algorithm corresponding to the scanning motion of the detector used to acquire the holograms; and reconstructing a subpixel ultra-resolution image of the image subject based on the processed holograms; whereby, a desired synthetic aperture is achieved without loss of resolution. The multispectral and hyperspectral aspect is achieved in the novel system and method by use of different combination of illumination sources (i.e., LEDs, laser sources, broadband lamps, etc.) and wavelength selection mechanisms (i.e., bandpass spectral filters, acousto-optical and liquid crystal tunable filters, a dispersing element, etc.).