Horizontal Pin Abutment for IC Layout Short Circuit Prevention
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Solution Overview
Problem
In advanced integrated circuit designs with small transistors, traditional abutment processes for horizontal pin connections often result in short circuits due to limited space and design rule constraints, necessitating an improved method to avoid such connections.
Innovation Solution
An abutment process is developed that evaluates the context of adjacent transistors with horizontal pins, swaps or shortens pins to ensure they connect to the same net, and merges overlapping pins to prevent short circuits, while adjusting pin style or size to comply with design rules.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If traditional abutment process is used for horizontal pin connections, then space utilization is improved, but short circuits occur due to overlapping pins
Solution Approach 1:
The patent segments the pin connection process into distinct evaluation and handling stages. It divides pins into different categories based on their connection status (overlapping vs. non-overlapping) and applies different processing rules to each segment, thereby preventing short circuits while maintaining space efficiency
Solution Approach 2:
The patent introduces an intermediary evaluation mechanism that assesses the context of adjacent transistors before performing abutment. This intermediary step analyzes pin connections and determines appropriate handling strategies, preventing direct harmful overlap while enabling safe optimizations
2Area of stationary object
If pins are overlapped during abutment to save space, then area efficiency is improved, but design rule violations occur
Solution Approach 1:
The patent implements a feedback mechanism where the abutment process continuously evaluates the context of adjacent transistors and pin connections. Based on this feedback, it dynamically adjusts the abutment strategy to maintain design rule compliance while optimizing area efficiency
Solution Approach 2:
The patent changes the parameters of pin connections by swapping or shortening pins based on contextual evaluation. This parameter modification allows the system to achieve better area efficiency while maintaining compliance with design rules through adaptive pin configuration
3Adaptability or versatility
If horizontal pin connection style is used to overcome layout constraints, then layout flexibility is improved, but pin short circuits are created
Solution Approach 1:
The patent performs preliminary evaluation of pin connections before finalizing the horizontal pin connection style. By assessing the context of adjacent transistors in advance, it identifies potential short circuit risks and applies preventive measures before the layout is finalized
Solution Approach 2:
Instead of simply connecting horizontal pins when they overlap, the patent inverts the approach by evaluating whether they should be connected based on contextual analysis. It may choose to swap or shorten pins instead of direct connection, thereby maintaining layout flexibility while preventing short circuits
Data Source
AI summary
A system and method for optimizing a design layout by identifying features for abutment where shapes of the features that trigger the abutment are overlapping or within a predefined proximity of each other. The abutment process is implemented for features that have overlapping pins or that will have overlapping pins when abutted. Connectivity of abutted features is analyzed for the overlapped pins; pins of one of the abutted features are swapped so that at least one overlapping set of horizontal pins is connected to a same net; and a pin of the abutted features can be shortened as necessary to prevent short-circuit between pins connected to different nets. The overlapping pins are then merged. Pins can be shortened by cutting the pin or by adjusting pin style or pin size.