Hot-Swap Semiconductor Error Correction via ECC and Buffer Isolation

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Solution Overview

Problem

Memory devices in electronic systems wear out over time, leading to unacceptable failure levels, which necessitates replacement, but existing methods interrupt system operation when replacing semiconductor devices.

Innovation Solution

Implementing a hot-swapping method using error-correction coding (ECC) to detect and correct errors, allowing semiconductor devices to be removed and replaced without interrupting system operation by using buffers to electrically isolate devices and re-encoding code words with additional check symbols for enhanced error protection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If semiconductor devices are replaced to maintain acceptable failure levels, then reliability is improved, but system operation is interrupted

Engineering Contradiction:

Improvefailure levelVSAvoidsystem operation continuity

Core Design Contradiction:

ReliabilityVSProductivity

Solution Approach 1:

The system performs preliminary error correction using ECC codes before the semiconductor device is completely removed. Check symbols are generated in advance and stored in replacement devices, allowing error correction to be performed during the hot-swap transition period without interrupting system operation.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

Error-correction coding acts as an intermediary mechanism that bridges the gap during device replacement. The ECC check symbols serve as a mediator that allows the system to tolerate and correct errors from removed devices, enabling seamless hot-swapping without system interruption.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Ease of operation

If buffers are used to electrically isolate semiconductor devices for hot-swapping, then ease of operation is improved, but device complexity increases

Engineering Contradiction:

Improvehot-swapping capabilityVSAvoidbuffer isolation mechanism

Core Design Contradiction:

Ease of operationVSDevice complexity

Solution Approach 1:

The system segments the semiconductor device group into independently controllable units with individual buffers. Each buffer can be independently enabled or disabled to electrically isolate specific devices, allowing targeted hot-swapping operations without affecting other devices in the group.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The buffer isolation mechanism is made dynamic, allowing buffers to be enabled or disabled on-demand during hot-swap operations. This dynamic control enables flexible device isolation and reconnection, facilitating seamless hot-swapping while managing complexity through controlled adaptability.

Inventive Principle:

Principle #15Dynamics

3Reliability

If additional check symbols are used for enhanced error protection during hot-swapping, then reliability is improved, but manufacturing precision requirements increase

Engineering Contradiction:

Improveerror toleranceVSAvoidcode word encoding

Core Design Contradiction:

ReliabilityVSManufacturing precision

Solution Approach 1:

The system changes the parameter of error correction capability by incorporating additional check symbols into the ECC code structure. This parameter change enables the system to tolerate more errors, including those that occur during hot-swap transitions, while maintaining manageable encoding complexity through structured code design.

Inventive Principle:

Principle #35Parameter changes

Data Source

PatentUS9484113B2Error-correction coding for hot-swapping semiconductor devices

Publication Date: 2016.11.01 ADVANCED MICRO DEVICES INC

AI summary

A memory read operation is directed at a group of semiconductor devices from which a first semiconductor device has been removed. An error in data for the memory read operation is detected based on error-correction coding (ECC). The error is caused at least in part by the first semiconductor device having been removed. ECC is used to determine corrected data for the memory read operation.