HPI Clock Centering Across Phase and Voltage Sweeps

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Solution Overview

Problem

High-performance interconnects like HPI are prone to bit errors due to voltage and temperature variations, causing clock signals to drift, which is exacerbated by their fast data rates, making them less fault-tolerant.

Innovation Solution

The implementation of a centering method that adjusts the clock signal to ensure it remains within a optimal window, using a combination of hardware and software to refine the phase and voltage settings, reducing bit errors by sampling data at the center of the clock signal's window.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If high-performance interconnect operates at extremely fast data rates (8 Gbps), then productivity is improved, but reliability deteriorates due to clock signal drift and bit errors

Engineering Contradiction:
Improvedata rateVSAvoidfault tolerance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent performs preliminary centering calibration of the clock signal before normal data transmission begins. The system samples data at multiple phase offsets and voltage levels to determine optimal clock timing and voltage settings, then applies these settings before high-speed operation starts. This preliminary action ensures the clock signal is properly centered to minimize bit errors during fast data rates.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback mechanisms that continuously monitor for bit errors and clock signal drift during operation. When drift is detected, the system adjusts the clock signal timing and voltage levels to maintain optimal centering. This closed-loop feedback ensures reliability is maintained even as operating conditions change over time.

Inventive Principle:
Principle #23Feedback

2Adaptability or versatility

If voltage and temperature variations occur over time, then adaptability is improved, but clock signal stability deteriorates causing drift from center

Engineering Contradiction:
Improvevoltage and temperature toleranceVSAvoidclock signal stability
Core Design Contradiction:
Adaptability or versatilityVSStability of the object's composition

Solution Approach 1:

The patent makes the clock signal parameters dynamic rather than fixed. The system continuously adjusts clock timing and voltage levels based on real-time sampling and error monitoring. This dynamic adaptation allows the clock signal to maintain optimal centering despite voltage and temperature variations, resolving the contradiction between adaptability and stability.

Inventive Principle:
Principle #15Dynamics

3Reliability

If centering calibration is performed to minimize bit errors, then reliability is improved, but device complexity increases due to hardware and software combination

Engineering Contradiction:
Improvebit error reductionVSAvoidhardware and software complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements self-service centering calibration where the system automatically performs its own calibration without external intervention. The hardware samples data and the software analyzes results to determine optimal settings, then applies these settings automatically. This self-service approach reduces the need for manual configuration and external testing equipment, justifying the increased internal complexity.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS10560081B2Method, apparatus, system for centering in a high performance interconnect
Publication Date: 2020.02.11 INTEL CORP
  • US10560081B2 patent drawing
  • US10560081B2 patent drawing
  • US10560081B2 patent drawing

AI summary

In an example, a system and method for centering in a high-performance interconnect (HPI) are disclosed. When an interconnect is powered up from a dormant state, it may be necessary to “center” the clock signal to ensure that data are read at the correct time. A multi-phase method may be used, in which a first phase comprises a reference voltage sweep to identify an optimal reference voltage. A second phase comprises a phase sweep to identify an optimal phase. A third sweep comprises a two-dimensional “eye” phase, in which a plurality of values within a two-dimensional eye derived from the first two sweeps are tested. In each case, the optimal value is the value that results in the fewest bit error across multiple lanes. In one example, the second and third phases are performed in software, and may include testing a “victim” lane, with adjacent “aggressor” lanes having a complementary bit pattern.