Hybrid 3D Inspection With Interferometry and Triangulation

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Solution Overview

Problem

Existing optical inspection methods for workpieces, such as printed circuit boards and display panels, face limitations in resolution and ambiguity in measuring 3D topography, with triangulation methods lacking precision and interferometric methods having cyclic ambiguity issues.

Innovation Solution

An optical inspection apparatus combining an interferometer module and a triangulation module, utilizing beam combiner optics to ensure accurate mutual registration of fields-of-view, allowing for high-resolution and unambiguous 3D mapping by integrating interferometric and triangulation measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of moving object

If triangulation methods are used to measure topography, then measurement range is improved, but measurement precision deteriorates

Engineering Contradiction:
Improvemeasurement rangeVSAvoidvertical resolution
Core Design Contradiction:
Length of moving objectVSMeasurement precision

Solution Approach 1:

The patent combines triangulation module and interferometer module into a hybrid inspection system. The triangulation module provides large measurement range while the interferometer module provides high vertical resolution. The beam combiner optics merge both measurement beams to inspect the same area, and the processor integrates both measurement results to achieve both large range and high precision simultaneously.

Inventive Principle:
Principle #5Merging (Combining)

2Measurement precision

If interferometric methods are used to measure topography, then measurement precision is improved, but measurement range deteriorates due to ambiguity

Engineering Contradiction:
Improvevertical resolutionVSAvoidunambiguous measurement range
Core Design Contradiction:
Measurement precisionVSLength of moving object

Solution Approach 1:

The processor uses the triangulation measurement results as feedback to resolve the ambiguity in interferometric measurements. Since triangulation provides unambiguous height information over large ranges, this information feeds back to determine the correct interference order for each pixel, thereby extending the unambiguous measurement range of the interferometer while maintaining its high precision.

Inventive Principle:
Principle #23Feedback

3Device complexity

If separate inspection areas are used for interferometer and triangulation modules, then device complexity is reduced, but measurement accuracy deteriorates due to misalignment

Engineering Contradiction:
Improveoptical system configurationVSAvoid3D measurement accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The beam combiner optics merge the optical paths of the interferometer module and triangulation module so that both modules inspect the same area on the workpiece. This ensures accurate spatial correspondence between the two measurement sets, enabling precise integration of results while maintaining relatively simple device configuration.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The combined system provides accurate and unambiguous 3D measurements over a wide range, leveraging the strengths of both methods to achieve precise topographical mapping with enhanced resolution and reduced ambiguity.

Implementation Method 1

produce a first image of interference fringes produced by combining the reflected beam with a reference beam

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

direct a beam of coherent light toward an area under inspection

Methodology Applied
Scientific EffectCoherent light: Coherent Light

Implementation Method 3

capture a second image of the pattern that is reflected from the area under inspection

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentEP4028719B1Hybrid 3D inspection system
Publication Date: 2025.11.05 ORBOTECH LTD
  • EP4028719B1 patent drawingFigure 1
  • EP4028719B1 patent drawingFigure 2a
  • EP4028719B1 patent drawingFigure 2b

AI summary

An optical inspection apparatus includes an interferometer module, which is configured to direct a beam of coherent light toward an area under inspection and to produce a first image of interference fringes of the area. The apparatus also includes a triangulation module configured to project a pattern of structured light onto the area, and at least one image sensor configured to capture the first image of interference fringes and a second image of the pattern that is reflected from the area. Beam combiner optics are configured to direct the beam of coherent light and the projected pattern to impinge on the same location on the area. A processor is configured to process the first and second images in order to generate a 3D map of the area.