Hybrid Optical-Electrical ATE for Simultaneous DUT Testing
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Solution Overview
Problem
Modern automatic test equipment (ATE) systems are not configured to rapidly test and calibrate hybrid high-speed devices, such as optical transceivers, which integrate both complex electrical and optical modules, due to their complex architectures and the need for simultaneous electrical and optical testing.
Innovation Solution
A hybrid optical-electrical ATE system is implemented, augmenting existing electrical ATE systems with dual interface optical assemblies for passive alignment, allowing simultaneous optical and electrical testing of photonic devices using optical and electrical interfaces, including fibers and gratings, to align and test optical and electrical components of the device under test.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional electrical ATE systems are used for testing optical transceivers, then the testing process becomes complex and time-consuming, but the system configuration remains simple
Solution Approach 1:
The patent combines optical and electrical testing interfaces into a single integrated ATE system. The load board incorporates both optical interfaces (with optical couplers and light sources) and electrical interfaces (with electrical contacts), allowing simultaneous testing of both optical and electrical components of the optical transceiver through one unified system rather than separate testing equipment.
Solution Approach 2:
The ATE system is designed with multi-functionality to handle both optical and electrical testing operations. The load board can simultaneously perform optical coupling tests using optical interfaces and electrical signal tests using electrical contacts, making the system universal for comprehensive optical transceiver characterization without requiring multiple specialized devices.
2Measurement precision
If simultaneous optical and electrical testing is implemented, then testing accuracy improves, but the device complexity increases
Solution Approach 1:
The load board is segmented into distinct optical and electrical testing regions. The optical interface section includes optical couplers and light sources for optical component testing, while the electrical interface section includes electrical contacts for electrical component testing. This segmentation allows independent optimization of each testing modality while maintaining simultaneous operation capability.
Solution Approach 2:
The patent introduces an intermediary alignment mechanism featuring alignment marks and positioning structures that facilitate precise registration between optical and electrical test components. These intermediary elements mediate the complex interaction between optical and electrical interfaces, enabling accurate simultaneous testing without requiring direct complex integration between the two interface types.
Data Source
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AI summary
A hybrid optical-electrical automated testing equipment (ATE) system can implement a workpress assembly that can interface with a device under test (DUT) and a load board that holds the DUT during testing, analysis, and calibration. A test hand can actuate to position the DUT on a socket and align one or more alignment features. The workpress assembly can include two optical interfaces that are optically coupled such that light can be provided to a side of the DUT that is facing away from the load board, thereby enabling the ATE system to perform simultaneous optical and electrical testing of the DUT.