Hybrid Surface Topology Mapping via Inertial and Total Station Data Fusion
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Solution Overview
Problem
Current land surveying instruments, such as total stations and RTK systems, face limitations in generating high-resolution surface topology maps due to line-of-sight restrictions and inferior accuracy in the Z direction, while inertial profiling systems provide relative profiles without absolute elevation readings, making them inadequate for applications requiring precise surface design and construction monitoring.
Innovation Solution
An apparatus that combines surface profiling data from inertial profiling systems with data from surveying instruments like total stations or RTK systems, using computing hardware to correlate and merge sample points, thereby filling gaps and enhancing resolution for generating high-resolution three-dimensional surface topology maps.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If total station is used for surveying, then measurement precision is improved, but line of sight requirement restricts surveying coverage
Solution Approach 1:
The patent combines total station surveying data with inertial profiler data and GPS information to create a hybrid surveying system. The total station provides high-precision Z-coordinate measurements where line of sight is available, while inertial profilers fill in data in areas without line of sight, and GPS provides X-Y positioning. This merging of multiple data sources resolves the contradiction by maintaining measurement precision through total station data while expanding surveying coverage through alternative measurement methods.
2Adaptability or versatility
If GPS information is used instead of line of sight measurements, then surveying coverage is improved, but vertical accuracy deteriorates
Solution Approach 1:
The patent uses the total station as an intermediary to transfer high-precision vertical measurements to GPS-based survey points. The total station measures the vertical position of prisms at GPS locations, providing accurate Z-coordinates that are then associated with the GPS X-Y coordinates. This intermediary measurement approach allows GPS to provide broad coverage while maintaining vertical accuracy through total station measurements at key locations.
3Productivity
If inertial profiler is used for surface profiling, then data collection speed is improved, but absolute elevation accuracy deteriorates
Solution Approach 1:
The patent replaces the inertial profiler's mechanical inertial measurement system with optical/laser-based total station measurements for absolute elevation determination. The inertial profiler continues to collect high-speed relative profile data, while the total station periodically measures absolute elevations of prisms placed along the profile. This substitution allows the system to maintain high data collection speed while obtaining accurate absolute elevation readings through optical measurement.
Data Source
AI summary
A profiling apparatus configured to generate a high-resolution surface topology map of a surface using surface profiling data combined with surveying data. The apparatus is configured to collect both a plurality of survey sample points and a plurality of profile sample points of the surface. The profile sample points are then correlated with the survey sample points in the Z direction. Once the correlation is performed, the correlated profile sample points are merged or “filled-in” between the survey sample points. The high-resolution surface topology map is generated from the merging of the survey and profile sample points. In various embodiments, the survey data may be generated using an inertial profiler, an inclinometer based walking device, or a rolling-reference type profile device.