Hybrid X-Ray Inspection Chain for PCB Defect Detection
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Solution Overview
Problem
Existing X-ray imaging systems for printed circuit boards are inefficient in detecting both surface and interior defects due to limitations in single-mode imaging chains, which are either area mode or linear scanning, leading to suboptimal inspection results.
Innovation Solution
A hybrid inspection system combining linear scanning and area mode detectors, such as flat panel detectors, to capture images using different imaging modes, optimizing the assignment of imaging chains based on cost functions and image quality metrics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single-mode imaging chain (area mode or linear scanning) is used, then the system structure is simple, but the defect detection capability is insufficient for both surface and interior defects
Solution Approach 1:
The patent combines multiple imaging chains (area mode detector and linear scanning detector) into a single hybrid inspection system. This merging allows the system to leverage the strengths of both imaging modes: area mode for capturing complete defect information and linear scanning for high-speed inspection, thereby improving overall defect detection capability while maintaining a unified system architecture.
Solution Approach 2:
The hybrid inspection system is designed to perform multiple inspection functions using different imaging modes. The area mode detector handles interior defect detection and comprehensive inspection, while the linear scanning detector handles surface defect detection and high-speed scanning. This multi-functionality allows a single system to address various defect types and inspection requirements.
2Reliability
If area mode detection is used, then comprehensive defect information is captured, but inspection time increases
Solution Approach 1:
The patent segments the inspection task into two parts: area mode detection for comprehensive defect information capture and linear scanning for rapid surface inspection. By dividing the inspection workload between these two modes, the system achieves both accurate defect detection and reduced inspection time, as each mode is optimized for its specific function.
Solution Approach 2:
The system applies partial action by using area mode detection only for regions requiring comprehensive inspection (interior defects), while using faster linear scanning for other regions (surface defects). This selective application of detection modes optimizes the balance between detection accuracy and inspection speed.
3Productivity
If linear scanning detection is used, then inspection speed is high, but signal-to-noise ratio is reduced
Solution Approach 1:
The patent segments the detection task by assigning linear scanning to surface defect inspection where speed is critical, and area mode detection to interior defect inspection where signal-to-noise ratio is paramount. This segmentation allows each detection mode to operate in its optimal performance range.
Solution Approach 2:
The control unit acts as an intermediary that coordinates between the two detection modes. It determines which mode to use based on the inspection requirements, and it integrates the results from both modes to produce comprehensive inspection outcomes, thereby balancing speed and precision.
4Reliability
If a hybrid configuration of multiple detectors is used, then defect detection capability is improved, but system complexity increases
Solution Approach 1:
The patent merges multiple detectors (area mode and linear scanning) into a unified hybrid inspection system with shared components. This merging reduces overall system complexity by eliminating redundant components and enabling resource sharing, while maintaining the complementary strengths of different detection modes.
Solution Approach 2:
The hybrid system is designed with multi-functionality, where a single system performs both area mode and linear scanning detection. This universal design reduces complexity compared to having separate dedicated systems for each detection mode, as the system can adapt its operation based on inspection requirements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances defect detection capabilities by improving signal-to-noise ratio and reducing inspection time, allowing for more efficient and flexible inspection of both surface and interior defects on printed circuit assemblies.
Implementation Method 1
automated X-ray imaging provides inspection for both visible and hidden defect types
Implementation Method 2
a plurality of detectors for inspecting an object, the plurality of detectors sharing one or more imaging chain components
Data Source
AI summary
The present invention discloses an inspection system comprising a plurality of detectors (10) for inspecting an object, the plurality of detectors (10) sharing one or more imaging chains for inspecting a plurality of regions of interest on the object being inspected, wherein the detectors (10) capture images of the object using a combination of different imaging modes, and each region of interest is inspected by one or more detectors (10).