Hybrid XRF Analysis System Optimizing Measurement Time
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Solution Overview
Problem
Current X-ray fluorescence (XRF) methods are time-consuming, especially when measuring samples with multiple components, particularly in industrial applications where high accuracy and precision are required, and existing solutions are costly or unsuitable for cost-sensitive applications.
Innovation Solution
A method that selectively uses wavelength dispersive XRF (WD-XRF) and energy dispersive XRF (ED-XRF) based on sophisticated criteria, including reciprocal sensitivity, peak-to-background ratios, and expected concentrations to optimize measurement time, employing a high-power X-ray source for ED-XRF to improve detection efficiency and reduce overall measurement time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If wavelength dispersive XRF (WD-XRF) is used to measure multiple components sequentially, then measurement precision is improved, but measurement time increases significantly
Solution Approach 1:
The patent segments the measurement process by dividing multiple components into different measurement groups. Components are measured in parallel using multiple detectors rather than sequentially, which reduces total measurement time while maintaining precision through the use of wavelength-selective crystals for each detector channel
Solution Approach 2:
The patent combines multiple X-ray detectors with wavelength-selective crystals into a single integrated measurement system. This allows simultaneous measurement of multiple components in parallel, resolving the contradiction between precision (achieved through wavelength selection) and time (reduced through parallel measurement)
2Loss of time
If a large number of X-ray detectors are used to measure multiple wavelengths in parallel, then measurement time is reduced, but equipment cost increases
Solution Approach 1:
The patent employs wavelength-selective crystals that can be configured to measure different wavelengths using the same detector hardware. This multi-functional approach allows a limited number of detectors to measure multiple components by switching crystal configurations, reducing equipment cost while maintaining parallel measurement capability
Solution Approach 2:
The patent uses a dynamic crystal configuration system where wavelength-selective crystals can be moved or switched between different positions to select different wavelengths. This dynamic reconfiguration allows the same detector to measure multiple components sequentially or in parallel groups, reducing the total number of detectors needed while maintaining fast measurement speed
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces the total measurement time while maintaining accuracy and precision, allowing for faster analysis of samples with multiple elements, particularly trace components, and is cost-effective by optimizing the use of XRF techniques.
Implementation Method 1
X-ray fluorescence (XRF) measurements allow the determination of the elemental composition of a sample
Implementation Method 2
an X-ray source, an X-ray detector and a sample stage for holding a sample
Implementation Method 3
a wavelength selecting crystal is provided between the sample stage and the X-ray detector to select only a particular wavelength for measurement by the X-ray detector
Implementation Method 4
an energy dispersive detector is used, i.e. a detector that measures the X-ray intensity as a function of energy
Data Source
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AI summary
Apparatus includes an X-ray source 10, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detector 14 again for measuring X-ray fluoresence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.