IBIS Model Generation for Signal Integrity
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Solution Overview
Problem
The existing IBIS models for simulating signal integrity in programmable devices are limited in coverage due to the exponential increase in required models for different input and operating parameters, leading to diminishing coverage and increased time consumption in generating models that account for process, voltage, and temperature variations.
Innovation Solution
Generating design-specific real-time IBIS models by extracting and merging I/O buffer settings and environmental conditions with predetermined simulation setups to create a second netlist, which is then simulated to produce accurate simulation models for integrated circuit designs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If generic IBIS models are used to cover different input and operating parameters, then the number of models required increases exponentially, but coverage is limited and storage costs increase
Solution Approach 1:
The patent applies parameter changes by dynamically adjusting IBIS model parameters based on actual PVT conditions detected during simulation. Instead of creating separate models for each condition, the system modifies parameters of a base model to reflect process, voltage, and temperature variations, thereby achieving comprehensive coverage without exponentially increasing model quantity
Solution Approach 2:
The patent implements universality by creating a single IBIS model structure that can serve multiple PVT conditions through parameter adjustment. The model is designed to be multi-functional, adapting to different operating conditions without requiring separate dedicated models for each scenario, thus reducing the total number of models needed
2Measurement precision
If separate IBIS models are generated for each PVT variation, then model accuracy improves, but generation time increases significantly
Solution Approach 1:
The patent applies preliminary action by pre-defining the structure and parameter relationships of the IBIS model before simulation. The framework for parameter adjustment is established in advance, allowing the model to quickly adapt to different PVT conditions during simulation without requiring time-consuming regeneration of entire models for each condition
Solution Approach 2:
The system achieves both accuracy and efficiency by making targeted parameter changes to the IBIS model based on detected PVT conditions. Rather than regenerating entire models, only specific parameters are adjusted, maintaining measurement precision while significantly reducing the time required to adapt models to different operating conditions
3Adaptability or versatility
If design-specific real-time IBIS models are generated, then full coverage of environmental conditions is achieved, but computational complexity increases
Solution Approach 1:
The patent reduces computational complexity by focusing parameter changes on only the critical IBIS model parameters that most significantly affect signal integrity under varying PVT conditions. This targeted approach achieves full environmental coverage while avoiding the need to recalculate or adjust all model parameters, thereby managing computational complexity effectively
Data Source
AI summary
Techniques generating a simulation model for a circuit design are disclosed. One of the techniques includes extracting a plurality design properties associated with the circuit design. The design properties are extracted from a netlist of the circuit design and may include an input/output (I/O) buffer setting extracted from a first netlist of the circuit design or an environmental condition associated with the circuit design. A second netlist for the circuit design is generated based on the design properties and is simulated based on the design properties. A simulation model for the circuit design is generated. In an exemplary embodiment, the simulation model reflects the I/O buffer setting or the environmental condition associated with the circuit design.


