Integrated Circuit Abnormality History for Ongoing Fault Status
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing integrated circuits lack the ability to determine whether an abnormal state is ongoing or has been resolved, despite storing information about detected abnormalities.
Innovation Solution
The integrated circuit includes an abnormality detection circuit with a first storage region for the latest detection result and a second storage region for detection history, allowing continuous monitoring of abnormal states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If only a single storage region is used to store abnormality detection information, then the device complexity is reduced, but the ability to determine whether an abnormal state is ongoing or has been resolved is lost
Solution Approach 1:
The storage region is divided into two separate regions: a first storage region for storing latest detection results and a second storage region for storing detection history. This segmentation allows the system to maintain both current status and historical information independently, enabling determination of whether abnormal states are ongoing or have been resolved without increasing overall device complexity.
Solution Approach 2:
The patent adds a temporal dimension to abnormality storage by separating current state (latest detection result) from historical state (detection history). This dimensional separation enables the system to track abnormality persistence over time, transforming a single-point-in-time storage approach into a time-series storage approach.
2Loss of information
If detailed detection history is stored, then the ability to analyze abnormal state patterns is improved, but the memory usage increases
Solution Approach 1:
The patent extracts only the essential information needed for abnormality analysis: the latest detection result and a binary indication of whether abnormalities have occurred in the past. By taking out only the critical data elements rather than storing complete historical records, the system maintains analytical capability while minimizing memory consumption.
Data Source
AI summary
An integrated circuit and an abnormality history management method, the integrated circuit includes an abnormality detection circuit configured to not only to detect the presence or absence of an abnormality but also to be capable of knowing whether the detected abnormality is still continuing or has already been resolved; a first storage region configured to store first information indicating a latest detection result of the abnormality detection circuit; and a second storage region configured to be provided corresponding to the first storage region and stores second information indicating a detection history of the abnormality detected by the abnormality detection circuit.